Inventor
CUTHBERT DAVID R
US25 patents
Patents
25 patentsUS6563299B1May 13, 2003
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC48 citations96
US7705677B2Apr 27, 2010
CMOS amplifiers with frequency compensating capacitors
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US7236415B2Jun 26, 2007
Sample and hold memory sense amplifier
MICRON TECHNOLOGY INC42 citations92
US7180370B2Feb 20, 2007
CMOS amplifiers with frequency compensating capacitors
MICRON TECHNOLOGY INC26 citations92
US7453751B2Nov 18, 2008
Sample and hold memory sense amplifier
MICRON TECHNOLOGY INC14 citations84
US7498875B2Mar 3, 2009
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers
MICRON TECHNOLOGY INC7 citations74
US7339431B2Mar 4, 2008
CMOS amplifiers with frequency compensating capacitors
MICRON TECHNOLOGY INC5 citations74
US7295081B2Nov 13, 2007
Time delay oscillator for integrated circuits
MICRON TECHNOLOGY INC5 citations74
US7230479B2Jun 12, 2007
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers
MICRON TECHNOLOGY INC9 citations74
US7202739B2Apr 10, 2007
CMOS amplifiers with frequency compensating capacitors
MICRON TECHNOLOGY INC4 citations74
US7145323B2Dec 5, 2006
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC4 citations73
US6822438B2Nov 23, 2004
Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer
MICRON TECHNOLOGY INC4 citations73
US7119563B2Oct 10, 2006
Integrated circuit characterization printed circuit board
MICRON TECHNOLOGY INC7 citations71
US6924637B2Aug 2, 2005
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device
MICRON TECHNOLOGY INC10 citations71
US7629858B2Dec 8, 2009
Time delay oscillator for integrated circuits
MICRON TECHNOLOGY INC2 citations63
US7417505B2Aug 26, 2008
CMOS amplifiers with frequency compensating capacitors
MICRON TECHNOLOGY INC2 citations63
US7339423B2Mar 4, 2008
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers
MICRON TECHNOLOGY INC2 citations63
US6967629B2Nov 22, 2005
Low profile antenna
MICRON TECHNOLOGY INC2 citations63
US7294790B2Nov 13, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7239152B2Jul 3, 2007
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7208959B2Apr 24, 2007
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7212013B2May 1, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52
US7208935B2Apr 24, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52
US7199593B2Apr 3, 2007
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52
US7271581B2Sep 18, 2007
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device
MICRON TECHNOLOGY INC0 citations50