Inventor
HOLLMAN KENNETH F
US15 patents
⚠️ This page may combine multiple inventors who share the name “HOLLMAN KENNETH F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICROMANIPULATOR COMPANY INC
9 patentsUS6744268B2Jun 1, 2004
High resolution analytical probe station
MICROMANIPULATOR COMPANY INC168 citations98
US6198299B1Mar 6, 2001
High Resolution analytical probe station
MICROMANIPULATOR COMPANY INC133 citations98
US4893914AJan 16, 1990
Test station
MICROMANIPULATOR COMPANY INC207 citations96
US6917195B2Jul 12, 2005
Wafer probe station
MICROMANIPULATOR COMPANY INC61 citations95
US6191598B1Feb 20, 2001
High resolution analytical probe station
MICROMANIPULATOR COMPANY INC35 citations95
US6424141B1Jul 23, 2002
Wafer probe station
MICROMANIPULATOR COMPANY INC87 citations94
US6621282B2Sep 16, 2003
High resolution analytical probe station
MICROMANIPULATOR COMPANY INC31 citations92
US6838895B2Jan 4, 2005
High resolution analytical probe station
MICROMANIPULATOR COMPANY INC10 citations73
US6803756B2Oct 12, 2004
Wafer probe station
MICROMANIPULATOR COMPANY INC7 citations70
MICROMANIPULATOR CO INC
3 patentsUS7180317B2Feb 20, 2007
High resolution analytical probe station
MICROMANIPULATOR CO INC42 citations95
US4607220AAug 19, 1986
Method and apparatus for low temperature testing of electronic components
MICROMANIPULATOR CO INC55 citations92
US4956923ASep 18, 1990
Probe assembly including touchdown sensor
MICROMANIPULATOR CO INC44 citations90