Inventor
KURTH CASEY R
US28 patents
Patents
28 patentsUS6243285B1Jun 5, 2001
ROM-embedded-DRAM
MICRON TECHNOLOGY INC52 citations96
US6134137AOct 17, 2000
Rom-embedded-DRAM
MICRON TECHNOLOGY INC54 citations96
US6130834AOct 10, 2000
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC53 citations96
US5627478AMay 6, 1997
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC59 citations96
US6192446B1Feb 20, 2001
Memory device with command buffer
MICRON TECHNOLOGY INC24 citations93
US6137737AOct 24, 2000
Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing
MICRON TECHNOLOGY INC16 citations93
US5732033AMar 24, 1998
Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing
MICRON TECHNOLOGY INC34 citations93
US7440255B2Oct 21, 2008
Capacitor constructions and methods of forming
MICRON TECHNOLOGY INC20 citations92
US6834022B2Dec 21, 2004
Partial array self-refresh
MICRON TECHNOLOGY INC42 citations92
US6255837B1Jul 3, 2001
Apparatus and method disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC18 citations92
US6055173AApr 25, 2000
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC19 citations92
US5721703AFeb 24, 1998
Reprogrammable option select circuit
MICRON TECHNOLOGY INC22 citations92
US5689455ANov 18, 1997
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC29 citations92
US6903991B2Jun 7, 2005
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC12 citations84
US6826071B2Nov 30, 2004
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC14 citations84
US6650587B2Nov 18, 2003
Partial array self-refresh
MICRON TECHNOLOGY INC14 citations84
US6385691B2May 7, 2002
Memory device with command buffer that allows internal command buffer jumps
MICRON TECHNOLOGY INC14 citations84
US6570400B2May 27, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC11 citations82
US6410385B2Jun 25, 2002
ROM-embedded-DRAM
MICRON TECHNOLOGY INC13 citations82
US6160413ADec 12, 2000
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC12 citations82
US6724238B2Apr 20, 2004
Antifuse circuit with improved gate oxide reliability
MICRON TECHNOLOGY INC12 citations74
US6611165B1Aug 26, 2003
Antifuse circuit with improved gate oxide reliabilty
MICRON TECHNOLOGY INC6 citations74
US6356491B1Mar 12, 2002
Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing
MICRON TECHNOLOGY INC6 citations74
US6661693B2Dec 9, 2003
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC7 citations73
US6646459B2Nov 11, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6590407B2Jul 8, 2003
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6445605B1Sep 3, 2002
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC13 citations73
US6255838B1Jul 3, 2001
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC9 citations73