Inventor

DU YUEZHONG

US2 patents

Patents

2 patents

US9277186B2Mar 1, 2016

Generating a wafer inspection process using bit failures and virtual inspection

KLA TENCOR CORP2 citations54

US10014229B2Jul 3, 2018

Generating a wafer inspection process using bit failures and virtual inspection

KLA TENCOR CORP0 citations44