Inventor

NELSON KEITH A

US42 patents

⚠️ This page may combine multiple inventors who share the name “NELSON KEITH A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NELSON KEITH A

MASSACHUSETTS INST TECHNOLOGY

Methods and systems for introducing electromagnetic radiation into photonic crystals

Determining the presence of defects in thin film structures

Measurement of material properties with optically induced phonons

Signal processing by optically manipulating polaritons

Device and method for time-resolved optical measurements

Measuring anisotropic mechanical properties of thin films

Method and device for generating spatially and temporally shaped optical waveforms

High-fidelity spatial light modulator

System and Method for terahertz frequency measurements

Acceleration of charged particles using spatially and temporally shaped electromagnetic radiation

Methods and system for optically correlating ultrashort optical waveforms

Characterization of materials with optically shaped acoustic waveforms

Phase-matched terahertz emitter

Dynamic wavelength shifting method

Detection of electromagnetic radiation using nonlinear materials

Polariton wave imaging

Systems, apparatus, and methods of nonlinear terahertz (THz) magnetic resonance measurement

Diffraction-based pulse shaping with a 2D optical modulator

Detection of electromagnetic radiation using nonlinear materials

EXXONMOBIL CHEM PATENTS INC

Polypropylene-based adhesive compositions

Polypropylene-based adhesive compositions

Adhesive alpha-olefin inter-polymers

Polypropylene-based adhesive compositions

Adhesive alpha-olefin inter-polymers

ACTIVE IMPULSE SYSTEMS INC

Method and device for measuring the thickness of opaque and transparent films

Method and device for measuring the thickness of opaque and transparent films

Method and device for measuring the thickness of opaque and transparent films

Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure

FINA TECHNOLOGY

Farnesene resins, rubber compositions, and tire compositions

Farnesene-based tackifying resins and adhesive compositions containing the same

Farnesene-based tackifying resins and adhesive compositions containing the same

Farnesene-based tackifying resins and adhesive compositions containing the same

(unassigned)

Method and device for measuring thin films and semiconductor substrates using reflection mode geometry

Exercise device

NELSON KEITH A

Oil filter drain tool

Multidimensional pulse shaper and spectrometer

MASSACHUSETTS INSTITTUE OF TEC

Optical measurements of stress in thin film materials

PHILIPS ELECTRONICS NA

Method and device using x-rays to measure thickness and composition of thin films

HWANG HAROLD Y

Detection of electromagnetic radiation using nonlinear materials

Hwang Harold Young

Systems, apparatus, and methods of nonlinear terahertz (THz) magnetic resonance measurement

Pein Brandt Christopher

Systems, methods, and apparatus for radiation detection

MAZNEV ALEXEI

Systems and methods for quality control of a periodic structure