Inventor
ASLAN MEHMET
US31 patents
⚠️ This page may combine multiple inventors who share the name “ASLAN MEHMET”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NAT SEMICONDUCTOR CORP
29 patentsUS6332710B1Dec 25, 2001
Multi-channel remote diode temperature sensor
NAT SEMICONDUCTOR CORP65 citations96
US6149299ANov 21, 2000
Direct temperature sensing of a semiconductor device semiconductor device
NAT SEMICONDUCTOR CORP140 citations96
US7828479B1Nov 9, 2010
Three-terminal dual-diode system for fully differential remote temperature sensors
NAT SEMICONDUCTOR CORP73 citations95
US7252432B1Aug 7, 2007
Efficient method of sharing diode pins on multi-channel remote diode temperature sensors
NAT SEMICONDUCTOR CORP34 citations93
US6778938B1Aug 17, 2004
Fan speed detection in the presence of PWM speed control
NAT SEMICONDUCTOR CORP45 citations92
US6765422B1Jul 20, 2004
High resolution fan control at high PWM frequency with a low clock frequency input
NAT SEMICONDUCTOR CORP25 citations92
US6757592B1Jun 29, 2004
Nonlinear fan control
NAT SEMICONDUCTOR CORP45 citations92
US6737824B1May 18, 2004
Fan acceleration control
NAT SEMICONDUCTOR CORP31 citations92
US6637934B1Oct 28, 2003
Constant offset buffer for reducing sampling time in a semiconductor temperature sensor
NAT SEMICONDUCTOR CORP33 citations92
US6480127B1Nov 12, 2002
Input sub-ranging converter system for sampling semiconductor temperature sensors
NAT SEMICONDUCTOR CORP43 citations92
US7150561B1Dec 19, 2006
Zero temperature coefficient (TC) current source for diode measurement
NAT SEMICONDUCTOR CORP35 citations91
US7089146B1Aug 8, 2006
Apparatus and method for sub-ranging conversion for temperature sensing
NAT SEMICONDUCTOR CORP37 citations91
US7082377B1Jul 25, 2006
Apparatus for error cancellation for dual diode remote temperature sensors
NAT SEMICONDUCTOR CORP46 citations91
US6808307B1Oct 26, 2004
Time-interleaved sampling of voltages for improving accuracy of temperature remote sensors
NAT SEMICONDUCTOR CORP43 citations91
US7825837B1Nov 2, 2010
Background calibration method for analog-to-digital converters
NAT SEMICONDUCTOR CORP21 citations90
US7825838B1Nov 2, 2010
Capacitor rotation method for removing gain error in sigma-delta analog-to-digital converters
NAT SEMICONDUCTOR CORP38 citations90
US7461974B1Dec 9, 2008
Beta variation cancellation in temperature sensors
NAT SEMICONDUCTOR CORP16 citations90
US7309157B1Dec 18, 2007
Apparatus and method for calibration of a temperature sensor
NAT SEMICONDUCTOR CORP39 citations89
US7031127B1Apr 18, 2006
Short circuit protection
NAT SEMICONDUCTOR CORP19 citations88
US8021042B1Sep 20, 2011
Beta variation cancellation in temperature sensors
NAT SEMICONDUCTOR CORP8 citations81
US7889251B1Feb 15, 2011
Method and device for white level calibration
NAT SEMICONDUCTOR CORP8 citations78
US7333038B1Feb 19, 2008
Eliminating the effects of the temperature coefficients of series resistance on temperature sensors
NAT SEMICONDUCTOR CORP8 citations74
US7541861B1Jun 2, 2009
Matching for time multiplexed transistors
NAT SEMICONDUCTOR CORP4 citations61
US7449943B1Nov 11, 2008
Matching for time multiplexed resistors
NAT SEMICONDUCTOR CORP2 citations61
US7766546B1Aug 3, 2010
Beta variation cancellation in temperature sensors
NAT SEMICONDUCTOR CORP4 citations60
US7230472B1Jun 12, 2007
Base current cancellation for bipolar junction transistor current summing bias voltage generator
NAT SEMICONDUCTOR CORP4 citations59
US6992512B1Jan 31, 2006
Output buffer
NAT SEMICONDUCTOR CORP2 citations58
US7304272B1Dec 4, 2007
Systems and methods for adjusting parameters of a temperature sensor for settling time reduction
NAT SEMICONDUCTOR CORP0 citations51
US6774676B1Aug 10, 2004
Dual threshold buffer with hysteresis
NAT SEMICONDUCTOR CORP1 citations50