P

Inventor

HADDAD SAMEER S

US58 patents
⚠️ This page may combine multiple inventors who share the name “HADDAD SAMEER S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

45 patents
US6269023B1Jul 31, 2001

Method of programming a non-volatile memory cell using a current limiter

ADVANCED MICRO DEVICES INC248 citations99
US5712815AJan 27, 1998

Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells

ADVANCED MICRO DEVICES INC387 citations99
US6252803B1Jun 26, 2001

Automatic program disturb with intelligent soft programming for flash cells

ADVANCED MICRO DEVICES INC109 citations98
US5617357AApr 1, 1997

Flash EEPROM memory with improved discharge speed using substrate bias and method therefor

ADVANCED MICRO DEVICES INC107 citations98
US5491657AFeb 13, 1996

Method for bulk (or byte) charging and discharging an array of flash EEPROM memory cells

ADVANCED MICRO DEVICES INC137 citations98
US5335198AAug 2, 1994

Flash EEPROM array with high endurance

ADVANCED MICRO DEVICES INC197 citations97
US5077691ADec 31, 1991

Flash EEPROM array with negative gate voltage erase operation

ADVANCED MICRO DEVICES INC318 citations97
US6735114B1May 11, 2004

Method of improving dynamic reference tracking for flash memory unit

ADVANCED MICRO DEVICES INC72 citations96
US6456531B1Sep 24, 2002

Method of drain avalanche programming of a non-volatile memory cell

ADVANCED MICRO DEVICES INC54 citations96
US6438037B1Aug 20, 2002

Threshold voltage compacting for non-volatile semiconductor memory designs

ADVANCED MICRO DEVICES INC64 citations96
US6240016B1May 29, 2001

Method to reduce read gate disturb for flash EEPROM application

ADVANCED MICRO DEVICES INC74 citations96
US4774197ASep 27, 1988

Method of improving silicon dioxide

ADVANCED MICRO DEVICES INC74 citations96
US6275415B1Aug 14, 2001

Multiple byte channel hot electron programming using ramped gate and source bias voltage

ADVANCED MICRO DEVICES INC63 citations95
US6795342B1Sep 21, 2004

System for programming a non-volatile memory cell

ADVANCED MICRO DEVICES INC30 citations93
US6294430B1Sep 25, 2001

Nitridization of the pre-ddi screen oxide

ADVANCED MICRO DEVICES INC38 citations93
US6172909B1Jan 9, 2001

Ramped gate technique for soft programming to tighten the Vt distribution

ADVANCED MICRO DEVICES INC68 citations93
US6043122AMar 28, 2000

Three-dimensional non-volatile memory

ADVANCED MICRO DEVICES INC18 citations93
US5815438ASep 29, 1998

Optimized biasing scheme for NAND read and hot-carrier write operations

ADVANCED MICRO DEVICES INC23 citations93
US5805499ASep 8, 1998

Channel hot-carrier page write for NAND applications

ADVANCED MICRO DEVICES INC38 citations93
US5790456AAug 4, 1998

Multiple bits-per-cell flash EEPROM memory cells with wide program and erase Vt window

ADVANCED MICRO DEVICES INC44 citations93
US5708588AJan 13, 1998

Flash EEPROM memory with improved discharged speed using substrate bias and method therefor

ADVANCED MICRO DEVICES INC21 citations93
US5590076ADec 31, 1996

Channel hot-carrier page write

ADVANCED MICRO DEVICES INC39 citations93
US6894932B1May 17, 2005

Dual cell memory device having a top dielectric stack

ADVANCED MICRO DEVICES INC19 citations92
US6735124B1May 11, 2004

Flash memory device having four-bit cells

ADVANCED MICRO DEVICES INC23 citations92
US6452840B1Sep 17, 2002

Feedback method to optimize electric field during channel erase of flash memory devices

ADVANCED MICRO DEVICES INC49 citations92
US6188609B1Feb 13, 2001

Ramped or stepped gate channel erase for flash memory application

ADVANCED MICRO DEVICES INC31 citations92
US6172914B1Jan 9, 2001

Concurrent erase verify scheme for flash memory applications

ADVANCED MICRO DEVICES INC30 citations92
US5875130AFeb 23, 1999

Method for programming flash electrically erasable programmable read-only memory

ADVANCED MICRO DEVICES INC20 citations92
US6046932AApr 4, 2000

Circuit implementation to quench bit line leakage current in programming and over-erase correction modes in flash EEPROM

ADVANCED MICRO DEVICES INC46 citations91
US5901090AMay 4, 1999

Method for erasing flash electrically erasable programmable read-only memory (EEPROM)

ADVANCED MICRO DEVICES INC30 citations90
US6894925B1May 17, 2005

Flash memory cell programming method and system

ADVANCED MICRO DEVICES INC17 citations84
US6862221B1Mar 1, 2005

Memory device having a thin top dielectric and method of erasing same

ADVANCED MICRO DEVICES INC16 citations84
US6518072B1Feb 11, 2003

Deposited screen oxide for reducing gate edge lifting

ADVANCED MICRO DEVICES INC15 citations84
US6469939B1Oct 22, 2002

Flash memory device with increase of efficiency during an APDE (automatic program disturb after erase) process

ADVANCED MICRO DEVICES INC16 citations84
US6157572ADec 5, 2000

Method for erasing flash electrically erasable programmable read-only memory (EEPROM)

ADVANCED MICRO DEVICES INC17 citations82
US6868014B1Mar 15, 2005

Memory device with reduced operating voltage having dielectric stack

ADVANCED MICRO DEVICES INC9 citations74
US6465835B1Oct 15, 2002

Charge gain/charge loss junction leakage prevention for flash technology by using double isolation/capping layer between lightly doped drain and gate

ADVANCED MICRO DEVICES INC7 citations74
US6448608B1Sep 10, 2002

Capping layer

ADVANCED MICRO DEVICES INC6 citations74
US6400608B1Jun 4, 2002

Accurate verify apparatus and method for NOR flash memory cells in the presence of high column leakage

ADVANCED MICRO DEVICES INC13 citations74
US6248627B1Jun 19, 2001

Method for protecting gate edges from charge gain/loss in semiconductor device

ADVANCED MICRO DEVICES INC8 citations74
US5945705AAug 31, 1999

Three-dimensional non-volatile memory

ADVANCED MICRO DEVICES INC13 citations74
US6337246B1Jan 8, 2002

Method for inhibiting tunnel oxide growth at the edges of a floating gate during semiconductor device processing

ADVANCED MICRO DEVICES INC13 citations73
US6268624B1Jul 31, 2001

Method for inhibiting tunnel oxide growth at the edges of a floating gate during semiconductor device processing

ADVANCED MICRO DEVICES INC11 citations73
US6589841B1Jul 8, 2003

Charge gain/charge loss junction leakage prevention for flash technology by using double isolation/capping layer between lightly doped drain and gate

ADVANCED MICRO DEVICES INC3 citations63
US6548334B1Apr 15, 2003

Capping layer

ADVANCED MICRO DEVICES INC5 citations63

CYPRESS SEMICONDUCTOR CORP

2 patents

ADVANCE MICRO DEVICES INC

1 patent

SPANSION LLC

1 patent

SEMICONDUCTOR COMPONENTS IND LLC

1 patent

Showing the top 50 of 58 patents by PatentIndex Score.