Inventor
HADDAD SAMEER S
US58 patents
⚠️ This page may combine multiple inventors who share the name “HADDAD SAMEER S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
45 patentsUS6269023B1Jul 31, 2001
Method of programming a non-volatile memory cell using a current limiter
ADVANCED MICRO DEVICES INC248 citations99
US5712815AJan 27, 1998
Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells
ADVANCED MICRO DEVICES INC387 citations99
US6252803B1Jun 26, 2001
Automatic program disturb with intelligent soft programming for flash cells
ADVANCED MICRO DEVICES INC109 citations98
US5617357AApr 1, 1997
Flash EEPROM memory with improved discharge speed using substrate bias and method therefor
ADVANCED MICRO DEVICES INC107 citations98
US5491657AFeb 13, 1996
Method for bulk (or byte) charging and discharging an array of flash EEPROM memory cells
ADVANCED MICRO DEVICES INC137 citations98
US5335198AAug 2, 1994
Flash EEPROM array with high endurance
ADVANCED MICRO DEVICES INC197 citations97
US5077691ADec 31, 1991
Flash EEPROM array with negative gate voltage erase operation
ADVANCED MICRO DEVICES INC318 citations97
US6735114B1May 11, 2004
Method of improving dynamic reference tracking for flash memory unit
ADVANCED MICRO DEVICES INC72 citations96
US6456531B1Sep 24, 2002
Method of drain avalanche programming of a non-volatile memory cell
ADVANCED MICRO DEVICES INC54 citations96
US6438037B1Aug 20, 2002
Threshold voltage compacting for non-volatile semiconductor memory designs
ADVANCED MICRO DEVICES INC64 citations96
US6240016B1May 29, 2001
Method to reduce read gate disturb for flash EEPROM application
ADVANCED MICRO DEVICES INC74 citations96
US4774197ASep 27, 1988
Method of improving silicon dioxide
ADVANCED MICRO DEVICES INC74 citations96
US6275415B1Aug 14, 2001
Multiple byte channel hot electron programming using ramped gate and source bias voltage
ADVANCED MICRO DEVICES INC63 citations95
US6795342B1Sep 21, 2004
System for programming a non-volatile memory cell
ADVANCED MICRO DEVICES INC30 citations93
US6294430B1Sep 25, 2001
Nitridization of the pre-ddi screen oxide
ADVANCED MICRO DEVICES INC38 citations93
US6172909B1Jan 9, 2001
Ramped gate technique for soft programming to tighten the Vt distribution
ADVANCED MICRO DEVICES INC68 citations93
US6043122AMar 28, 2000
Three-dimensional non-volatile memory
ADVANCED MICRO DEVICES INC18 citations93
US5815438ASep 29, 1998
Optimized biasing scheme for NAND read and hot-carrier write operations
ADVANCED MICRO DEVICES INC23 citations93
US5805499ASep 8, 1998
Channel hot-carrier page write for NAND applications
ADVANCED MICRO DEVICES INC38 citations93
US5790456AAug 4, 1998
Multiple bits-per-cell flash EEPROM memory cells with wide program and erase Vt window
ADVANCED MICRO DEVICES INC44 citations93
US5708588AJan 13, 1998
Flash EEPROM memory with improved discharged speed using substrate bias and method therefor
ADVANCED MICRO DEVICES INC21 citations93
US5590076ADec 31, 1996
Channel hot-carrier page write
ADVANCED MICRO DEVICES INC39 citations93
US6894932B1May 17, 2005
Dual cell memory device having a top dielectric stack
ADVANCED MICRO DEVICES INC19 citations92
US6735124B1May 11, 2004
Flash memory device having four-bit cells
ADVANCED MICRO DEVICES INC23 citations92
US6452840B1Sep 17, 2002
Feedback method to optimize electric field during channel erase of flash memory devices
ADVANCED MICRO DEVICES INC49 citations92
US6188609B1Feb 13, 2001
Ramped or stepped gate channel erase for flash memory application
ADVANCED MICRO DEVICES INC31 citations92
US6172914B1Jan 9, 2001
Concurrent erase verify scheme for flash memory applications
ADVANCED MICRO DEVICES INC30 citations92
US5875130AFeb 23, 1999
Method for programming flash electrically erasable programmable read-only memory
ADVANCED MICRO DEVICES INC20 citations92
US6046932AApr 4, 2000
Circuit implementation to quench bit line leakage current in programming and over-erase correction modes in flash EEPROM
ADVANCED MICRO DEVICES INC46 citations91
US5901090AMay 4, 1999
Method for erasing flash electrically erasable programmable read-only memory (EEPROM)
ADVANCED MICRO DEVICES INC30 citations90
US6894925B1May 17, 2005
Flash memory cell programming method and system
ADVANCED MICRO DEVICES INC17 citations84
US6862221B1Mar 1, 2005
Memory device having a thin top dielectric and method of erasing same
ADVANCED MICRO DEVICES INC16 citations84
US6518072B1Feb 11, 2003
Deposited screen oxide for reducing gate edge lifting
ADVANCED MICRO DEVICES INC15 citations84
US6469939B1Oct 22, 2002
Flash memory device with increase of efficiency during an APDE (automatic program disturb after erase) process
ADVANCED MICRO DEVICES INC16 citations84
US6157572ADec 5, 2000
Method for erasing flash electrically erasable programmable read-only memory (EEPROM)
ADVANCED MICRO DEVICES INC17 citations82
US6868014B1Mar 15, 2005
Memory device with reduced operating voltage having dielectric stack
ADVANCED MICRO DEVICES INC9 citations74
US6465835B1Oct 15, 2002
Charge gain/charge loss junction leakage prevention for flash technology by using double isolation/capping layer between lightly doped drain and gate
ADVANCED MICRO DEVICES INC7 citations74
US6448608B1Sep 10, 2002
Capping layer
ADVANCED MICRO DEVICES INC6 citations74
US6400608B1Jun 4, 2002
Accurate verify apparatus and method for NOR flash memory cells in the presence of high column leakage
ADVANCED MICRO DEVICES INC13 citations74
US6248627B1Jun 19, 2001
Method for protecting gate edges from charge gain/loss in semiconductor device
ADVANCED MICRO DEVICES INC8 citations74
US5945705AAug 31, 1999
Three-dimensional non-volatile memory
ADVANCED MICRO DEVICES INC13 citations74
US6337246B1Jan 8, 2002
Method for inhibiting tunnel oxide growth at the edges of a floating gate during semiconductor device processing
ADVANCED MICRO DEVICES INC13 citations73
US6268624B1Jul 31, 2001
Method for inhibiting tunnel oxide growth at the edges of a floating gate during semiconductor device processing
ADVANCED MICRO DEVICES INC11 citations73
US6589841B1Jul 8, 2003
Charge gain/charge loss junction leakage prevention for flash technology by using double isolation/capping layer between lightly doped drain and gate
ADVANCED MICRO DEVICES INC3 citations63
US6548334B1Apr 15, 2003
Capping layer
ADVANCED MICRO DEVICES INC5 citations63
CYPRESS SEMICONDUCTOR CORP
2 patentsADVANCE MICRO DEVICES INC
1 patentSPANSION LLC
1 patentSEMICONDUCTOR COMPONENTS IND LLC
1 patentShowing the top 50 of 58 patents by PatentIndex Score.