Inventor
DAEHN WILFRIED
DE7 patents
Patents
7 patentsUS6539505B1Mar 25, 2003
Method of testing a semiconductor memory, and semiconductor memory with a test device
INFINEON TECHNOLOGIES AG22 citations90
US6601194B1Jul 29, 2003
Circuit configuration for repairing a semiconductor memory
INFINEON TECHNOLOGIES AG15 citations83
US6320804B2Nov 20, 2001
Integrated semiconductor memory with a memory unit a memory unit for storing addresses of defective memory cells
INFINEON TECHNOLOGIES AG19 citations81
US6560731B2May 6, 2003
Method for checking the functioning of memory cells of an integrated semiconductor memory
INFINEON TECHNOLOGIES AG2 citations61
US6949946B1Sep 27, 2005
Integrated semiconductor circuit and method for functional testing of pad cells
INFINEON TECHNOLOGIES AG4 citations60
US6505314B2Jan 7, 2003
Method and apparatus for processing defect addresses
INFINEON TECHNOLOGIES AG2 citations60
US6359820B2Mar 19, 2002
Integrated memory and method for checking the operation of memory cells in an integrated memory
INFINEON TECHNOLOGIES AG3 citations54