Inventor
DREVILLON BERNARD
FR21 patents
⚠️ This page may combine multiple inventors who share the name “DREVILLON BERNARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CENTRE NAT RECH SCIENT
7 patentsUS6177995B1Jan 23, 2001
Polarimeter and corresponding measuring method
CENTRE NAT RECH SCIENT45 citations90
US6175412B1Jan 16, 2001
Optical component for polarization modulation, a mueller polarimeter and ellipsometer containing such an optical component, a process for the calibration of this ellipsometer, and an ellipsometric measurement process
CENTRE NAT RECH SCIENT43 citations90
US5757671AMay 26, 1998
Multi-detector ellipsometer and process of multi-detector ellipsometric measurement
CENTRE NAT RECH SCIENT50 citations89
US5485271AJan 16, 1996
Dual-modulation interferometric ellipsometer
CENTRE NAT RECH SCIENT32 citations86
US6613434B1Sep 2, 2003
Method for treating polymer surface
CENTRE NAT RECH SCIENT21 citations84
US6914675B1Jul 5, 2005
Ellipsometric method and control device for making a thin-layered component
CENTRE NAT RECH SCIENT6 citations62
US7863113B2Jan 4, 2011
Transistor for active matrix display and a method for producing said transistor
CENTRE NAT RECH SCIENT4 citations56
ECOLE POLYTECH
5 patentsUS7196792B2Mar 27, 2007
Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process
ECOLE POLYTECH11 citations82
US7298480B2Nov 20, 2007
Broadband ellipsometer / polarimeter system
ECOLE POLYTECH18 citations80
US7859661B2Dec 28, 2010
Polarimetric Raman system and method for analysing a sample
ECOLE POLYTECH6 citations60
US9366694B2Jun 14, 2016
Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
ECOLE POLYTECH2 citations56
US7777880B2Aug 17, 2010
Metrological characterisation of microelectronic circuits
ECOLE POLYTECH0 citations40