Inventor
COMMONS MARTIN
US3 patents
Patents
3 patentsUS6849495B2Feb 1, 2005
Selective silicidation scheme for memory devices
INFINEON TECHNOLOGIES AG9 citations70
US6440759B1Aug 27, 2002
Method of measuring combined critical dimension and overlay in single step
INFINEON TECHNOLOGIES AG10 citations68
US6566227B2May 20, 2003
Strap resistance using selective oxidation to cap DT poly before STI etch
INFINEON TECHNOLOGIES AG6 citations59