Inventor
ABRAHAM JAIS
IN10 patents
⚠️ This page may combine multiple inventors who share the name “ABRAHAM JAIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
6 patentsUS7404126B2Jul 22, 2008
Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputs
TEXAS INSTRUMENTS INC20 citations92
US7352169B2Apr 1, 2008
Testing components of I/O paths of an integrated circuit
TEXAS INSTRUMENTS INC21 citations88
US6853212B2Feb 8, 2005
Gated scan output flip-flop
TEXAS INSTRUMENTS INC23 citations87
US7421634B2Sep 2, 2008
Sequential scan based techniques to test interface between modules designed to operate at different frequencies
TEXAS INSTRUMENTS INC4 citations59
US7082558B2Jul 25, 2006
Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis
TEXAS INSTRUMENTS INC6 citations53
US6981190B2Dec 27, 2005
Controlling the content of specific desired memory elements when testing integrated circuits using sequential scanning techniques
TEXAS INSTRUMENTS INC0 citations38
QUALCOMM INC
4 patentsUS10656203B1May 19, 2020
Low pin count test controller
QUALCOMM INC7 citations80
US12327599B2Jun 10, 2025
Memory with scan chain testing of column redundancy logic and multiplexing
QUALCOMM INC0 citations62
US11935606B2Mar 19, 2024
Memory with scan chain testing of column redundancy logic and multiplexing
QUALCOMM INC1 citations62
US10996267B2May 4, 2021
Time interleaved scan system
QUALCOMM INC1 citations59