Inventor
WATABE KAZUO
JP100 patents
⚠️ This page may combine multiple inventors who share the name “WATABE KAZUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
46 patentsUS6301208B1Oct 9, 2001
Optical disk having radial lands and grooves, and boundary recognition marks, and optical disk apparatus for emitting a light beam to an optical disk having a plurality of error correction blocks after boundary recognition marks
TOSHIBA KK57 citations96
US9757858B2Sep 12, 2017
Gripping device and method for taking out an article
TOSHIBA KK30 citations94
US7075877B2Jul 11, 2006
Information storage medium, information recording method, and information recording/reproduction apparatus
TOSHIBA KK16 citations93
US10351362B2Jul 16, 2019
Transfer apparatus and article taking-out method
TOSHIBA KK10 citations84
US7345984B2Mar 18, 2008
Information storage medium, recording method, reproducing method, and reproducing apparatus
TOSHIBA KK9 citations84
US7924691B2Apr 12, 2011
Information storage medium, recording method, and recording apparatus
TOSHIBA KK4 citations74
US6388964B2May 14, 2002
Optical disk apparatus
TOSHIBA KK10 citations74
US6292446B1Sep 18, 2001
Optical disk apparatus for reproducing information by shifting the light beam position away from the center line of the prepit arrays of an optical disk
TOSHIBA KK8 citations74
US6262954B1Jul 17, 2001
Optical disk apparatus
TOSHIBA KK13 citations74
US6130871AOct 10, 2000
Optical disk apparatus and optical disk
TOSHIBA KK15 citations74
US10955383B2Mar 23, 2021
Detection device, detection system, and detection method
TOSHIBA KK1 citations73
US10365250B2Jul 30, 2019
Detection device, detection system, and detection method
TOSHIBA KK1 citations73
US10018597B2Jul 10, 2018
Detection system and detection method
TOSHIBA KK4 citations73
US11718084B1Aug 8, 2023
Object adhesion/peeling method, and object adhesion/peeling device
TOSHIBA KK2 citations72
US10794990B2Oct 6, 2020
Structure evaluation apparatus, structure evaluation system, and structure evaluation method
TOSHIBA KK2 citations72
US10613060B2Apr 7, 2020
Structure evaluation system, structure evaluation apparatus, and structure evaluation method
TOSHIBA KK4 citations72
US10345275B2Jul 9, 2019
Structure evaluation system, structure evaluation apparatus, and structure evaluation method
TOSHIBA KK2 citations72
US10330646B2Jun 25, 2019
Structure evaluation system, structure evaluation apparatus, and structure evaluation method
TOSHIBA KK2 citations72
US11879815B2Jan 23, 2024
Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method
TOSHIBA KK0 citations63
US7426167B2Sep 16, 2008
Information storage medium, recording method, reproducing method, and reproducing apparatus
TOSHIBA KK2 citations63
US7411888B2Aug 12, 2008
Information storage medium, recording method, reproducing method, and reproducing apparatus
TOSHIBA KK3 citations63
US7352683B2Apr 1, 2008
Information storage medium, recording method, reproducing method, and reproducing apparatus
TOSHIBA KK2 citations63
US6167006ADec 26, 2000
Optical information recording/reproducing apparatus based on tracking control of irradiated light
TOSHIBA KK5 citations63
US6147952ANov 14, 2000
Optical disk apparatus for reproducing information from an optical recording medium
TOSHIBA KK5 citations63
US12272236B2Apr 8, 2025
Vehicle information estimation system, vehicle information estimation apparatus, vehicle information estimation method, and non-transitory computer readable recording medium
TOSHIBA KK0 citations62
US12169189B2Dec 17, 2024
Structure evaluation system, structure evaluation apparatus, and structure evaluation method
TOSHIBA KK0 citations62
US11668681B2Jun 6, 2023
Detection device, detection system, and detection method
TOSHIBA KK0 citations62
US11417824B2Aug 16, 2022
Sensor module
TOSHIBA KK1 citations62
US11002711B2May 11, 2021
Detection system, detection method, and server device
TOSHIBA KK0 citations62
US10793378B2Oct 6, 2020
Transfer apparatus and article taking-out method
TOSHIBA KK1 citations62
US10712318B2Jul 14, 2020
Sensor adhesion state determination system, sensor adhesion state determination device, and sensor adhesion state determination method
TOSHIBA KK1 citations62
US7283447B2Oct 16, 2007
Optical disc and optical disc apparatus
TOSHIBA KK5 citations62
US7190663B2Mar 13, 2007
Optical recording medium, information reproduction apparatus, and information recording/reproduction apparatus
TOSHIBA KK5 citations62
US6987714B2Jan 17, 2006
Disk, disk device and track center detection method
TOSHIBA KK3 citations62
US6741546B2May 25, 2004
Information recording medium, information recording apparatus, and information reproduction apparatus
TOSHIBA KK2 citations62
US5946283AAug 31, 1999
Optical information recording medium and optical information reproducing device
TOSHIBA KK3 citations62
US12306139B2May 20, 2025
Sensor module, sensor module installation device, and mounting method of sensor module
TOSHIBA KK0 citations61
US12038349B2Jul 16, 2024
Inspection system, inspection apparatus, and inspection method
TOSHIBA KK0 citations61
US11371875B2Jun 28, 2022
Nondestructive inspection method and nondestructive inspection system
TOSHIBA KK0 citations61
US7668064B2Feb 23, 2010
Optical pickup unit and information recording/reproduction apparatus
TOSHIBA KK4 citations61
US10883919B2Jan 5, 2021
Structure evaluation system and structure evaluation method
TOSHIBA KK0 citations60
US11639880B2May 2, 2023
Structure evaluation system and structure evaluation method
TOSHIBA KK0 citations59
US11181439B2Nov 23, 2021
Structure evaluation system and structure evaluation method
TOSHIBA KK0 citations59
US11073498B2Jul 27, 2021
Detection system, detection device, and detection method
TOSHIBA KK1 citations57
US12007363B2Jun 11, 2024
Measuring method and measuring device
TOSHIBA KK0 citations52
US11474081B2Oct 18, 2022
Sensor module
TOSHIBA KK0 citations52
SHISEIDO CO LTD
2 patentsTAKEDA CHEMICAL INDUSTRIES LTD
1 patentUNIV TOKYO
1 patentShowing the top 50 of 100 patents by PatentIndex Score.