Inventor

PERNER MARTIN

DE35 patents

⚠️ This page may combine multiple inventors who share the name “PERNER MARTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PERNER MARTIN

INFINEON TECHNOLOGIES AG

Integrated memory and method for testing and repairing the integrated memory

Integrated dynamic memory and operating method

Memory module and method for operating a memory module

Integrated dynamic memory and operating method

Method and device for determining an operating temperature of a semiconductor component

Electronic memory apparatus and method for operating an electronic memory apparatus

Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit

Inputting and outputting operating parameters for an integrated semiconductor memory device

Circuit and method for refreshing memory cells of a dynamic memory

Circuit and method for evaluating and controlling a refresh rate of memory cells of a dynamic memory

Circuit and method for refreshing memory cells of a dynamic memory

Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit

Sheet-like electrooptical component, light-guide configuration for serial, bidirectional signal transmission and optical printed circuit board

Method for testing memory

Method of operating a memory unit sector

Integrated semiconductor memory with redundant memory cells

Memory unit and method of operating a memory unit sector

Nonvolatile memory cell and methods for operating a nonvolatile memory cell

Integrated semiconductor memory device with test circuit for sense amplifier

Integrated semiconductor memory device

Integrated semiconductor memory

Semiconductor module and methods for functionally testing and configuring a semiconductor module

Light guide configuration for serial bi-directional signal transmission, optical circuit board, and fabrication method

Testing memory cells by allocating an access value to a memory access and granting an access credit

Testing memory cells by allocating an access value to a memory access and granting an access credit

Semi-conductor component, as well as a process for the in-or output of test data

Integrated memory and method for checking the functioning of an integrated memory

Memory device and method for testing memory devices with repairable redundancy

Memory unit and method of operating a memory unit sector

Integrated semiconductor memory

Memory arrangement in a computer system

Circuit configuration and method for measuring at least one operating parameter for an integrated circuit

Method for operating a semiconductor memory, and semiconductor memory

Method and apparatus for data transmission

QIMONDA AG

Buffer circuit for a memory module