Inventor

YOSHIZUMI KEIICHI

JP49 patents

⚠️ This page may combine multiple inventors who share the name “YOSHIZUMI KEIICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YOSHIZUMI KEIICHI

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Optical probe

Error correcting method for measuring object surface using three-dimension measuring apparatus

Configuration measuring apparatus

Shape measuring apparatus and method

Measurement probe and using method for the same

Method and apparatus for transferring a thin plate

Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force

Profilometer and method for measuring, and method for manufacturing object of surface profiling

Optical device for optically recording and reproducing information signals on an information carrier

Apparatus and method for measuring width of micro gap

Apparatus for measuring birefringence without employing rotating mechanism

Three-dimensional measuring apparatus

Optical head apparatus for optical disc player

Optical measuring device

Optical measuring apparatus

Optical information system having a birefringence plate movably disposed in accordance with the detected light intensity

Apparatus and method for measuring flatness of thin plate

Method and apparatus for quantitative quality inspection of substrate such as wafer

Configuration measuring apparatus and method

HITACHI LTD

Method for manufacturing semiconductor integrated circuit device having a fuse element

Semiconductor memory device having ferroelectric film and manufacturing method thereof

Semiconductor memory device and manufacturing method thereof

Semiconductor integrated circuit device having capacitance element and process of manufacturing the same

Semiconductor integrated circuit device and process of manufacturing the same

Semiconductor integrated circuit device

Method of manufacturing a ferroelectric memory device

Ferroelectric memory device and method for manufacturing the same

Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions

Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions

Process for producing semiconductor integrated circuit device

Gate circuit, semiconductor integrated circuit device and method of fabrication thereof, semiconductor memory and microprocessor

Process for producing semiconductor integrated circuit

Semiconductor memory device and manufacturing method thereof

Ferroelectric memory device

Ferroelectric memory device including an upper protection electrode

RENESAS TECH CORP

Method of manufacturing a semiconductor device that includes a process for forming a high breakdown voltage field effect transistor

Semiconductor device and a method of manufacturing the same

Semiconductor device and a method of manufacturing the same

Semiconductor device and a method of manufacturing the same

Semiconductor device and a method of manufacturing the same

Ferroelectric memory device

Semiconductor device with MISFET that includes embedded insulating film arranged between source/drain regions and channel

Semiconductor memory device and manufacturing method thereof

PANASONIC CORP

Three-dimensional measurement probe

Shape measuring apparatus and shape measuring method

Shape measurement device probe and shape measurement device

MATSUSHITA ELECTRIC INUDSTRIAL

Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus

MARSUSHITA ELECTRIC IND CO LTD

Profile measuring apparatus

YOSHIZUMI KEIICHI

Semiconductor device and a method of manufacturing the same