Inventor

NAGAO TAKURO

JP2 patents

⚠️ This page may combine multiple inventors who share the name “NAGAO TAKURO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NUFLARE TECHNOLOGY INC

1 patent

US12046445B2Jul 23, 2024

Electron beam inspection apparatus and electron beam inspection method

NUFLARE TECHNOLOGY INC4 citations65

TOSHIBA KK

1 patent

US7359043B2Apr 15, 2008

Pattern inspecting method and pattern inspecting apparatus

TOSHIBA KK4 citations60