Inventor

MILLER CURTIS E

US3 patents

Patents

3 patents

US7323899B2Jan 29, 2008

System and method for resumed probing of a wafer

TEXAS INSTRUMENTS INC38 citations87

US7148716B2Dec 12, 2006

System and method for the probing of a wafer

TEXAS INSTRUMENTS INC10 citations68

US7853640B2Dec 14, 2010

Key distribution

TEXAS INSTRUMENTS INC1 citations44