Inventor

VASILYEV LEONID A

US4 patents

⚠️ This page may combine multiple inventors who share the name “VASILYEV LEONID A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FEI CO

1 patent

US6399944B1Jun 4, 2002

Measurement of film thickness by inelastic electron scattering

FEI CO77 citations90

ARBORE MARK A

1 patent

US8299416B2Oct 30, 2012

High speed quantum efficiency measurement apparatus utilizing solid state lightsource

ARBORE MARK A11 citations78

VASILYEV LEONID A

1 patent

US8278937B2Oct 2, 2012

High speed detection of shunt defects in photovoltaic and optoelectronic devices

VASILYEV LEONID A8 citations77

TAU SCIENCE CORP

1 patent

US9537444B2Jan 3, 2017

Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing process

TAU SCIENCE CORP0 citations28