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Inventor
DU WEICHAO
CN
2 patents
Patents
2 patents
US9785047B2
Oct 10, 2017
Method and device for measuring large-area and massive scattered field in nanoscale
UNIV HUAZHONG SCIENCE TECH
1 citations
41
US9103667B2
Aug 11, 2015
Alignment method for optical axes of composite waveplate
UNIV HUAZHONG SCIENCE TECH
0 citations
36