Inventor
BADGETT KEVIN
US3 patents
⚠️ This page may combine multiple inventors who share the name “BADGETT KEVIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHEN WEI-YU
2 patentsUS8468408B2Jun 18, 2013
Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods
CHEN WEI-YU2 citations57
US8423846B2Apr 16, 2013
Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods
CHEN WEI-YU3 citations57