Inventor
DUTTA AMITABHA
IN3 patents
Patents
3 patentsUS7234355B2Jun 26, 2007
Method and system for inspecting flaws using ultrasound scan data
GEN ELECTRIC72 citations94
US7233867B2Jun 19, 2007
Eddy current inspection method and system
GEN ELECTRIC23 citations88
US7521917B2Apr 21, 2009
Method and apparatus for testing material integrity
GEN ELECTRIC6 citations56