Inventor
BULLOCK EUGENE T
US3 patents
Patents
3 patentsUS7902849B2Mar 8, 2011
Apparatus and method for test structure inspection
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US7994476B2Aug 9, 2011
Apparatus and method for enhancing voltage contrast of a wafer
APPLIED MATERIALS ISRAEL LTD9 citations79
US11022565B2Jun 1, 2021
Process monitoring
APPLIED MATERIALS ISRAEL LTD4 citations69