Inventor
LEE YI-CHIA
TW38 patents
⚠️ This page may combine multiple inventors who share the name “LEE YI-CHIA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VERSUM MAT US LLC
24 patentsUS10870799B2Dec 22, 2020
Etching solution for selectively removing tantalum nitride over titanium nitride during manufacture of a semiconductor device
VERSUM MAT US LLC2 citations73
US12110435B2Oct 8, 2024
Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC3 citations72
US11180697B2Nov 23, 2021
Etching solution having silicon oxide corrosion inhibitor and method of using the same
VERSUM MAT US LLC2 citations72
US10934485B2Mar 2, 2021
Etching solution for selectively removing silicon over silicon-germanium alloy from a silicon-germanium/ silicon stack during manufacture of a semiconductor device
VERSUM MAT US LLC3 citations70
US12298669B2May 13, 2025
Composition comprising three alkanolamines and a hydroxylamine for removing etch residues
VERSUM MAT US LLC0 citations62
US12110436B2Oct 8, 2024
Co/Cu selective wet etchant
VERSUM MAT US LLC0 citations62
US11946148B2Apr 2, 2024
Hafnium oxide corrosion inhibitor
VERSUM MAT US LLC0 citations62
US11186771B2Nov 30, 2021
Etching solution for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC0 citations62
US10934484B2Mar 2, 2021
Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/ germanium stack during manufacture of a semiconductor device
VERSUM MAT US LLC1 citations62
US10301580B2May 28, 2019
Stripping compositions having high WN/W etching selectivity
VERSUM MAT US LLC1 citations62
US11091727B2Aug 17, 2021
Post etch residue cleaning compositions and methods of using the same
VERSUM MAT US LLC0 citations61
US12281251B2Apr 22, 2025
Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC0 citations60
US11955341B2Apr 9, 2024
Etching solution and method for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC0 citations60
US11499236B2Nov 15, 2022
Etching solution for tungsten word line recess
VERSUM MAT US LLC1 citations60
US11035044B2Jun 15, 2021
Etching solution for tungsten and GST films
VERSUM MAT US LLC1 citations60
US10879076B2Dec 29, 2020
Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/silicon stack during manufacture of a semiconductor device
VERSUM MAT US LLC1 citations60
US10400167B2Sep 3, 2019
Etching compositions and methods for using same
VERSUM MAT US LLC1 citations59
US11017995B2May 25, 2021
Composition for TiN hard mask removal and etch residue cleaning
VERSUM MAT US LLC1 citations58
US10954480B2Mar 23, 2021
Compositions and methods for preventing collapse of high aspect ratio structures during drying
VERSUM MAT US LLC0 citations57
US11175587B2Nov 16, 2021
Stripper solutions and methods of using stripper solutions
VERSUM MAT US LLC1 citations56
US11929257B2Mar 12, 2024
Etching solution and method for aluminum nitride
VERSUM MAT US LLC0 citations51
US10711227B2Jul 14, 2020
TiN hard mask and etch residue removal
VERSUM MAT US LLC0 citations51
US9957469B2May 1, 2018
Copper corrosion inhibition system
VERSUM MAT US LLC0 citations51
US12518966B2Jan 6, 2026
Selective plasma enhanced atomic layer deposition
VERSUM MAT US LLC0 citations45
AIR PROD & CHEM
7 patentsUS9976111B2May 22, 2018
TiN hard mask and etch residual removal
AIR PROD & CHEM5 citations72
US9472420B2Oct 18, 2016
Composition for titanium nitride hard mask and etch residue removal
AIR PROD & CHEM2 citations62
US9201308B2Dec 1, 2015
Water-rich stripping and cleaning formulation and method for using same
AIR PROD & CHEM3 citations61
US9536730B2Jan 3, 2017
Cleaning formulations
AIR PROD & CHEM0 citations51
US10073351B2Sep 11, 2018
Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation
AIR PROD & CHEM1 citations49
US8357646B2Jan 22, 2013
Stripper for dry film removal
AIR PROD & CHEM1 citations46
US10072237B2Sep 11, 2018
Photoresist cleaning composition used in photolithography and a method for treating substrate therewith
AIR PROD & CHEM1 citations45
TAIWAN SEMICONDUCTOR MFG CO LTD
3 patentsUS10961118B2Mar 30, 2021
Wafer level integrated MEMS device enabled by silicon pillar and smart cap
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10556792B2Feb 11, 2020
Wafer level integrated MEMS device enabled by silicon pillar and smart cap
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10899608B2Jan 26, 2021
Wafer level integrated MEMS device enabled by silicon pillar and smart cap
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61