Inventor
HOQUE Shahedul
JP20 patents
⚠️ This page may combine multiple inventors who share the name “HOQUE Shahedul”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
17 patentsUS10872745B2Dec 22, 2020
Charged-particle beam system
HITACHI HIGH TECH CORP7 citations84
US8618499B1Dec 31, 2013
Electron beam irradiation apparatus
HITACHI HIGH TECH CORP6 citations84
US10720306B2Jul 21, 2020
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US10249474B2Apr 2, 2019
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US9697987B2Jul 4, 2017
Charged particle beam device
HITACHI HIGH TECH CORP9 citations83
US9053905B2Jun 9, 2015
Electron beam irradiation apparatus
HITACHI HIGH TECH CORP4 citations73
US11694873B2Jul 4, 2023
Charged particle beam apparatus
HITACHI HIGH TECH CORP2 citations72
US11515120B2Nov 29, 2022
Charged particle beam apparatus
HITACHI HIGH TECH CORP4 citations72
US11139144B2Oct 5, 2021
Charged particle beam apparatus
HITACHI HIGH TECH CORP5 citations71
US11798780B2Oct 24, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US11239052B2Feb 1, 2022
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US10984979B2Apr 20, 2021
Charged particle detector and charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations62
US10593512B2Mar 17, 2020
Light guide, detector having light guide, and charged particle beam device
HITACHI HIGH TECH CORP1 citations62
US11749497B2Sep 5, 2023
Charged particle beam apparatus
HITACHI HIGH TECH CORP1 citations61
US10984981B2Apr 20, 2021
Charged particle beam device having inspection scan direction based on scan with smaller dose
HITACHI HIGH TECH CORP1 citations60
US10546715B2Jan 28, 2020
Charged particle beam device
HITACHI HIGH TECH CORP1 citations60
US10679821B1Jun 9, 2020
Light guide, detector having light guide, and charged particle beam device
HITACHI HIGH TECH CORP0 citations52