Inventor
NAYAK DEEPAK KUMAR
IN23 patents
⚠️ This page may combine multiple inventors who share the name “NAYAK DEEPAK KUMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
XILINX INC
10 patentsUS7429775B1Sep 30, 2008
Method of fabricating strain-silicon CMOS
XILINX INC68 citations97
US7214629B1May 8, 2007
Strain-silicon CMOS with dual-stressed film
XILINX INC89 citations97
US7851313B1Dec 14, 2010
Semiconductor device and process for improved etch control of strained silicon alloy trenches
XILINX INC37 citations92
US7670923B1Mar 2, 2010
Method of fabricating strain-silicon CMOS
XILINX INC22 citations92
US7423283B1Sep 9, 2008
Strain-silicon CMOS using etch-stop layer and method of manufacture
XILINX INC18 citations92
US7936006B1May 3, 2011
Semiconductor device with backfilled isolation
XILINX INC8 citations84
US7875543B1Jan 25, 2011
Strain-silicon CMOS using etch-stop layer and method of manufacture
XILINX INC9 citations84
US7429526B1Sep 30, 2008
Method of forming silicide gate with interlayer
XILINX INC7 citations73
US7772093B2Aug 10, 2010
Method of and circuit for protecting a transistor formed on a die
XILINX INC2 citations62
US7655991B1Feb 2, 2010
CMOS device with stressed sidewall spacers
XILINX INC4 citations62
NOKIA SOLUTIONS & NETWORKS OY
5 patentsUS11425591B1Aug 23, 2022
Beam selection for cellular access nodes
NOKIA SOLUTIONS & NETWORKS OY3 citations71
US12526031B2Jan 13, 2026
Beam configuration optimization
NOKIA SOLUTIONS & NETWORKS OY0 citations61
US12143183B2Nov 12, 2024
Beam and antenna array split configuration optimization
NOKIA SOLUTIONS & NETWORKS OY0 citations50
US11012133B2May 18, 2021
Efficient data generation for beam pattern optimization
NOKIA SOLUTIONS & NETWORKS OY0 citations50
US11843426B2Dec 12, 2023
Method for determining beam interference
NOKIA SOLUTIONS & NETWORKS OY0 citations47
AMAZON TECH INC
3 patentsUS10339470B1Jul 2, 2019
Techniques for generating machine learning training data
AMAZON TECH INC95 citations94
US10909144B1Feb 2, 2021
Taxonomy generation with statistical analysis and auditing
AMAZON TECH INC10 citations83
US10726060B1Jul 28, 2020
Classification accuracy estimation
AMAZON TECH INC8 citations79
ADVANCED MICRO DEVICES INC
3 patentsUS5817536AOct 6, 1998
Method to optimize p-channel CMOS ICs using Qbd as a monitor of boron penetration
ADVANCED MICRO DEVICES INC17 citations84
US5757204AMay 26, 1998
Method and circuit for detecting boron ("B") in a semiconductor device using threshold voltage ("V") fluence test
ADVANCED MICRO DEVICES INC11 citations73
US5920104AJul 6, 1999
Reducing reverse short-channel effect with light dose of P with high dose of as in n-channel LDD
ADVANCED MICRO DEVICES INC13 citations68