P

Inventor

NAD SUDDHASATTWA

US33 patents
⚠️ This page may combine multiple inventors who share the name “NAD SUDDHASATTWA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

32 patents
US11177232B2Nov 16, 2021

Circuit device with monolayer bonding between surface structures

INTEL CORP2 citations69
US12224103B2Feb 11, 2025

Angled inductor with small form factor

INTEL CORP1 citations62
US12002745B2Jun 4, 2024

High performance integrated RF passives using dual lithography process

INTEL CORP0 citations62
US11948848B2Apr 2, 2024

Subtractive etch resolution implementing a functional thin metal resist

INTEL CORP0 citations62
US11658055B2May 23, 2023

Customizable release layers to enable low warpage architectures for advanced packaging applications

INTEL CORP0 citations62
US11404389B2Aug 2, 2022

In-situ component fabrication of a highly efficient, high inductance air core inductor integrated into substrate packages

INTEL CORP0 citations62
US11257748B2Feb 22, 2022

Semiconductor package having polymeric interlayer disposed between conductive elements and dielectric layer

INTEL CORP0 citations62
US11227825B2Jan 18, 2022

High performance integrated RF passives using dual lithography process

INTEL CORP0 citations62
US10971416B2Apr 6, 2021

Package power delivery using plane and shaped vias

INTEL CORP0 citations62
US10410939B2Sep 10, 2019

Package power delivery using plane and shaped vias

INTEL CORP1 citations62
US12568817B2Mar 3, 2026

Surface functionalization of sinx thin film by wet etching for improved adhesion of metal-dielectric for HSIO

INTEL CORP0 citations61
US12255147B2Mar 18, 2025

Electronic substrate having an embedded etch stop to control cavity depth in glass layers therein

INTEL CORP0 citations61
US11817349B2Nov 14, 2023

Conductive route patterning for electronic substrates

INTEL CORP0 citations61
US11694898B2Jul 4, 2023

Hybrid fine line spacing architecture for bump pitch scaling

INTEL CORP0 citations61
US11445616B2Sep 13, 2022

Interfacial layer for high resolution lithography (HRL) and high speed input/output (IO or I/O) architectures

INTEL CORP0 citations61
US11177234B2Nov 16, 2021

Package architecture with improved via drill process and method for forming such package

INTEL CORP0 citations61
US12575427B2Mar 10, 2026

Defect-free through glass via metallization implementing a sacrificial resist thinning material

INTEL CORP0 citations60
US12412868B2Sep 9, 2025

Microelectronic assemblies including interconnects with different solder materials

INTEL CORP0 citations60
US12159825B2Dec 3, 2024

Dielectric-to-metal adhesion promotion material

INTEL CORP0 citations60
US11574993B2Feb 7, 2023

Package architecture with tunable magnetic properties for embedded devices

INTEL CORP0 citations60
US11528811B2Dec 13, 2022

Method, device and system for providing etched metallization structures

INTEL CORP0 citations60
US11116084B2Sep 7, 2021

Method, device and system for providing etched metallization structures

INTEL CORP0 citations60
US12543578B2Feb 3, 2026

Electronic packaging architecture with customized variable metal thickness on same buildup layer

INTEL CORP0 citations59
US12349282B2Jul 1, 2025

Capacitors in through glass vias

INTEL CORP0 citations59
US12074102B2Aug 27, 2024

Structural elements for application specific electronic device packages

INTEL CORP0 citations59
US11291122B2Mar 29, 2022

Apparatus with a substrate provided with plasma treatment

INTEL CORP0 citations58
US12027466B2Jul 2, 2024

Conductive route patterning for electronic substrates

INTEL CORP0 citations51
US11942334B2Mar 26, 2024

Microelectronic assemblies having conductive structures with different thicknesses

INTEL CORP0 citations50
US11721650B2Aug 8, 2023

Method for fabricating multiplexed hollow waveguides of variable type on a semiconductor package

INTEL CORP0 citations49
US11501967B2Nov 15, 2022

Selective metal deposition by patterning direct electroless metal plating

INTEL CORP0 citations49
US12033930B2Jul 9, 2024

Selectively roughened copper architectures for low insertion loss conductive features

INTEL CORP0 citations47
US12476175B2Nov 18, 2025

Glass substrates having transverse capacitors for use with semiconductor packages and related methods

INTEL CORP0 citations45

THE INTEL CORP

1 patent