Inventor
CAI XIAOLEI
US3 patents
Patents
3 patentsUS10528692B1Jan 7, 2020
Cell-aware defect characterization for multibit cells
SYNOPSYS INC17 citations79
US11334698B2May 17, 2022
Cell-aware defect characterization by considering inter-cell timing
SYNOPSYS INC0 citations49
US10515167B2Dec 24, 2019
Cell-aware defect characterization and waveform analysis using multiple strobe points
SYNOPSYS INC0 citations39