Inventor
HUANG CHENG-TUNG
TW71 patents
⚠️ This page may combine multiple inventors who share the name “HUANG CHENG-TUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
39 patentsUS7288822B1Oct 30, 2007
Semiconductor structure and fabricating method thereof
UNITED MICROELECTRONICS CORP48 citations95
US9722093B1Aug 1, 2017
Oxide semiconductor transistor and manufacturing method thereof
UNITED MICROELECTRONICS CORP47 citations93
US7342284B2Mar 11, 2008
Semiconductor MOS transistor device and method for making the same
UNITED MICROELECTRONICS CORP16 citations92
US7524716B2Apr 28, 2009
Fabricating method of semiconductor structure
UNITED MICROELECTRONICS CORP16 citations91
US7700450B2Apr 20, 2010
Method for forming MOS transistor
UNITED MICROELECTRONICS CORP18 citations84
US7622344B2Nov 24, 2009
Method of manufacturing complementary metal oxide semiconductor transistors
UNITED MICROELECTRONICS CORP14 citations84
US7462542B2Dec 9, 2008
Method of fabricating semiconductor devices and method of adjusting lattice distance in device channel
UNITED MICROELECTRONICS CORP12 citations84
US7410875B2Aug 12, 2008
Semiconductor structure and fabrication thereof
UNITED MICROELECTRONICS CORP12 citations84
US10056463B2Aug 21, 2018
Transistor and manufacturing method thereof
UNITED MICROELECTRONICS CORP13 citations83
US7618856B2Nov 17, 2009
Method for fabricating strained-silicon CMOS transistors
UNITED MICROELECTRONICS CORP13 citations83
US10483264B2Nov 19, 2019
FinFET CMOS device including single diffusion break in each of NMOS and PMOS regions
UNITED MICROELECTRONICS CORP4 citations82
US9508799B2Nov 29, 2016
Substrate of semiconductor device including epitaxial layer and silicon layer having same crystalline orientation
UNITED MICROELECTRONICS CORP6 citations82
US6127212AOct 3, 2000
Method of forming a CMOS transistor
UNITED MICROELECTRONICS CORP17 citations81
US11238912B1Feb 1, 2022
Magnetoresistive random-access memory
UNITED MICROELECTRONICS CORP3 citations71
US10651235B1May 12, 2020
2-transistor 2-magnetic tunnel junction (2T2MTJ) MRAM structure
UNITED MICROELECTRONICS CORP4 citations69
US7927954B2Apr 19, 2011
Method for fabricating strained-silicon metal-oxide semiconductor transistors
UNITED MICROELECTRONICS CORP2 citations63
US7888194B2Feb 15, 2011
Method of fabricating semiconductor device
UNITED MICROELECTRONICS CORP3 citations63
US7888223B2Feb 15, 2011
Method for fabricating P-channel field-effect transistor (FET)
UNITED MICROELECTRONICS CORP3 citations63
US7682890B2Mar 23, 2010
Method of fabricating semiconductor device
UNITED MICROELECTRONICS CORP2 citations63
US7585790B2Sep 8, 2009
Method for forming semiconductor device
UNITED MICROELECTRONICS CORP2 citations63
US7508053B2Mar 24, 2009
Semiconductor MOS transistor device and method for making the same
UNITED MICROELECTRONICS CORP2 citations63
US7485517B2Feb 3, 2009
Fabricating method of semiconductor device
UNITED MICROELECTRONICS CORP3 citations63
US7326622B2Feb 5, 2008
Method of manufacturing semiconductor MOS transistor device
UNITED MICROELECTRONICS CORP4 citations63
US7875520B2Jan 25, 2011
Method of forming CMOS transistor
UNITED MICROELECTRONICS CORP6 citations62
US7642166B2Jan 5, 2010
Method of forming metal-oxide-semiconductor transistors
UNITED MICROELECTRONICS CORP3 citations62
US7494878B2Feb 24, 2009
Metal-oxide-semiconductor transistor and method of forming the same
UNITED MICROELECTRONICS CORP4 citations62
US7135365B2Nov 14, 2006
Method of manufacturing MOS transistors
UNITED MICROELECTRONICS CORP5 citations62
US6544849B2Apr 8, 2003
Method of fabricating semiconductor device for preventing polysilicon line being damaged during removal of photoresist
UNITED MICROELECTRONICS CORP4 citations62
US12178052B2Dec 24, 2024
MRAM circuit structure and layout structure
UNITED MICROELECTRONICS CORP1 citations61
US11942130B2Mar 26, 2024
Bottom-pinned spin-orbit torque magnetic random access memory and method of manufacturing the same
UNITED MICROELECTRONICS CORP0 citations61
US11903325B2Feb 13, 2024
Magnetic memory device having shared source line and bit line
UNITED MICROELECTRONICS CORP0 citations61
US11355695B2Jun 7, 2022
Magnetic memory device having shared source line and bit line
UNITED MICROELECTRONICS CORP0 citations61
US12586623B2Mar 24, 2026
Pulse signal generator system for a magnetoresistive random access memory array
UNITED MICROELECTRONICS CORP0 citations60
US12567450B2Mar 3, 2026
MRAM circuit and layout
UNITED MICROELECTRONICS CORP0 citations60
US11699705B2Jul 11, 2023
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations60
US11637103B2Apr 25, 2023
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations60
US11171137B2Nov 9, 2021
Method of making FinFET CMOS device including single diffusion break in each of NMOS and PMOS regions
UNITED MICROELECTRONICS CORP0 citations60
US10978122B1Apr 13, 2021
Memory including non-volatile cells and current driving circuit
UNITED MICROELECTRONICS CORP0 citations60
US6635537B2Oct 21, 2003
Method of fabricating gate oxide
UNITED MICROELECTRONICS CORP6 citations59
EDWARDS LIFESCIENCES CORP
4 patentsUS10500047B2Dec 10, 2019
Methods for delivering prosthetic valves to native heart valves
EDWARDS LIFESCIENCES CORP25 citations93
US11696827B2Jul 11, 2023
Retaining mechanisms for prosthetic valves
EDWARDS LIFESCIENCES CORP1 citations72
US12257150B2Mar 25, 2025
Retaining mechanisms for prosthetic valves
EDWARDS LIFESCIENCES CORP0 citations62
US11969344B2Apr 30, 2024
Retaining mechanisms for prosthetic valves
EDWARDS LIFESCIENCES CORP0 citations62
HUNG WEN-HAN
3 patentsUS8390073B2Mar 5, 2013
Transistor structure
HUNG WEN-HAN6 citations83
US8183640B2May 22, 2012
Method of fabricating transistors and a transistor structure for improving short channel effect and drain induced barrier lowering
HUNG WEN-HAN6 citations83
US8486795B2Jul 16, 2013
Method of fabricating transistors
HUNG WEN-HAN2 citations61
EMEMORY TECHNOLOGY INC
2 patentsTING SHYH-FANN
2 patentsShowing the top 50 of 71 patents by PatentIndex Score.