Inventor
HAINICK YANIR
IL21 patents
⚠️ This page may combine multiple inventors who share the name “HAINICK YANIR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR LTD
10 patentsUS10161885B2Dec 25, 2018
Optical phase measurement method and system
NOVA MEASURING INSTR LTD5 citations83
US11029258B2Jun 8, 2021
Optical phase measurement method and system
NOVA MEASURING INSTR LTD2 citations72
US10732116B2Aug 4, 2020
Hybrid metrology method and system
NOVA MEASURING INSTR LTD2 citations72
US10564106B2Feb 18, 2020
Raman spectroscopy based measurements in patterned structures
NOVA MEASURING INSTR LTD2 citations72
US10073045B2Sep 11, 2018
Optical method and system for measuring isolated features of a structure
NOVA MEASURING INSTR LTD2 citations72
US10365231B2Jul 30, 2019
Optical phase measurement method and system
NOVA MEASURING INSTR LTD1 citations71
US9897553B2Feb 20, 2018
Optical phase measurement method and system
NOVA MEASURING INSTR LTD1 citations61
US10274435B2Apr 30, 2019
Method and system for optical metrology in patterned structures
NOVA MEASURING INSTR LTD1 citations59
US10663408B2May 26, 2020
Optical phase measurement system and method
NOVA MEASURING INSTR LTD0 citations51
US10761036B2Sep 1, 2020
Method and system for optical metrology in patterned structures
NOVA MEASURING INSTR LTD0 citations49
NOVA LTD
9 patentsUS12066385B2Aug 20, 2024
Raman spectroscopy based measurements in patterned structures
NOVA LTD1 citations72
US12366533B2Jul 22, 2025
Hybrid metrology method and system
NOVA LTD0 citations62
US12025560B2Jul 2, 2024
Hybrid metrology method and system
NOVA LTD0 citations62
US11275027B2Mar 15, 2022
Raman spectroscopy based measurements in patterned structures
NOVA LTD0 citations62
US11150190B2Oct 19, 2021
Hybrid metrology method and system
NOVA LTD0 citations62
US12467879B2Nov 11, 2025
Optical phase measurement method and system
NOVA LTD0 citations61
US11946875B2Apr 2, 2024
Optical phase measurement system and method
NOVA LTD0 citations61
US11460415B2Oct 4, 2022
Optical phase measurement system and method
NOVA LTD0 citations61
US11366398B2Jun 21, 2022
Time-domain optical metrology and inspection of semiconductor devices
NOVA LTD0 citations44