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Inventor
LAPADAT CURTIS
CA
2 patents
Patents
2 patents
US5835501A
Nov 10, 1998
Built-in test scheme for a jitter tolerance test of a clock and data recovery unit
PMC SIERRA LTD
83 citations
93
US6185713B1
Feb 6, 2001
Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing
PMC SIERRA LTD
4 citations
55