Inventor
ZAINUDDIN ABU NASER
US21 patents
⚠️ This page may combine multiple inventors who share the name “ZAINUDDIN ABU NASER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES LLC
9 patentsUS11205493B1Dec 21, 2021
Controlling word line voltages to reduce read disturb in a memory device
SANDISK TECHNOLOGIES LLC7 citations84
US11875043B1Jan 16, 2024
Loop dependent word line ramp start time for program verify of multi-level NAND memory
SANDISK TECHNOLOGIES LLC3 citations74
US12046314B2Jul 23, 2024
NAND memory with different pass voltage ramp rates for binary and multi-state memory
SANDISK TECHNOLOGIES LLC4 citations73
US11139018B1Oct 5, 2021
Memory device with temporary kickdown of source voltage before sensing
SANDISK TECHNOLOGIES LLC2 citations72
US12354664B2Jul 8, 2025
Non-volatile memory with loop dependant ramp-up rate
SANDISK TECHNOLOGIES LLC1 citations64
US11705206B2Jul 18, 2023
Modifying program and erase parameters for single-bit memory cells to improve single-bit/multi-bit hybrid ratio
SANDISK TECHNOLOGIES LLC1 citations62
US12176032B2Dec 24, 2024
Word line dependent pass voltage ramp rate to improve performance of NAND memory
SANDISK TECHNOLOGIES LLC1 citations58
US11475957B2Oct 18, 2022
Optimized programming with a single bit per memory cell and multiple bits per memory cell
SANDISK TECHNOLOGIES LLC0 citations51
US12099728B2Sep 24, 2024
Non-volatile memory with programmable resistance non-data word line
SANDISK TECHNOLOGIES LLC0 citations49
SANDISK TECHNOLOGIES INC
9 patentsUS12387802B2Aug 12, 2025
Non-volatile memory with lower current program-verify
SANDISK TECHNOLOGIES INC1 citations64
US12524177B2Jan 13, 2026
Automatic bit line voltage and bit line voltage temperature compensation adjustment for non-volatile memory apparatus current consumption reduction
SANDISK TECHNOLOGIES INC0 citations62
US12475959B2Nov 18, 2025
Non-volatile memory with current detection circuit
SANDISK TECHNOLOGIES INC0 citations61
US12394491B2Aug 19, 2025
Apparatus and method for selectively reducing charge pump speed during erase operations
SANDISK TECHNOLOGIES INC0 citations61
US12494260B2Dec 9, 2025
Program verify word line ramping delay for lower current consumption mode
SANDISK TECHNOLOGIES INC0 citations52
US12456531B2Oct 28, 2025
Separate peak current checkpoints for closed and open block read ICC countermeasures in NAND memory
SANDISK TECHNOLOGIES INC0 citations52
US12417809B2Sep 16, 2025
Open block read ICC reduction
SANDISK TECHNOLOGIES INC0 citations52
US12555640B2Feb 17, 2026
Suppression of peak ICC during block selection in non-volatile memories
SANDISK TECHNOLOGIES INC0 citations50
US12462877B2Nov 4, 2025
Program pulse duration increase for NAND program failure
SANDISK TECHNOLOGIES INC0 citations50