Inventor · disambiguated record
Zvi Nir
Also filed as: NIR ZVI
4 granted patents·1 pending application·54 citations·filing 1989–2023
70Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD3ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1KLIL IND LTD1
Top patents by PatentIndex Score
5 records- 0191US7759642B2Pattern invariant focusing of a charged particle beamAPPLIED MATERIALS ISRAEL LTD·Filed 2008·Granted Jul 20, 2010·48 cites·18 claims
- 0257US2025182266A1Wafer inspection using a dynamic scan planAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0347US10249472B2Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2017·Granted Apr 2, 2019·0 cites·18 claims
- 0433US4952452AAluminum profile coated with organic resin and non-leafing pigmentsKLIL IND LTD·Filed 1989·Granted Aug 28, 1990·6 cites·6 claims
- 0528US10541104B2System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflectionAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 21, 2020·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →