P

Inventor

NARIZUKA YASUNORI

JP25 patents
⚠️ This page may combine multiple inventors who share the name “NARIZUKA YASUNORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RENESAS TECH CORP

12 patents
US7049837B2May 23, 2006

Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method

RENESAS TECH CORP65 citations97
US7219422B2May 22, 2007

Fabrication method of semiconductor integrated circuit device

RENESAS TECH CORP21 citations91
US7776626B2Aug 17, 2010

Manufacturing method of semiconductor integrated circuit device

RENESAS TECH CORP15 citations84
US7724006B2May 25, 2010

Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device

RENESAS TECH CORP12 citations84
US7423439B2Sep 9, 2008

Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device

RENESAS TECH CORP12 citations83
US7235413B2Jun 26, 2007

Fabrication method of semiconductor integrated circuit device

RENESAS TECH CORP13 citations83
US7351597B2Apr 1, 2008

Fabrication method of semiconductor integrated circuit device

RENESAS TECH CORP10 citations82
US7656174B2Feb 2, 2010

Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device

RENESAS TECH CORP7 citations74
US7598100B2Oct 6, 2009

Manufacturing method of semiconductor integrated circuit device

RENESAS TECH CORP4 citations62
US7407823B2Aug 5, 2008

Manufacturing method of semiconductor integrated circuit device

RENESAS TECH CORP2 citations62
US7534629B2May 19, 2009

Manufacturing method of semiconductor integrated circuit device

RENESAS TECH CORP4 citations60
US7537943B2May 26, 2009

Method of manufacturing a semiconductor integrated circuit device

RENESAS TECH CORP0 citations41

HITACHI LTD

9 patents

RENESAS ELECTRONICS CORP

2 patents

HASEBE AKIO

2 patents