Inventor
TAKAHASHI MASAKAZU
JP62 patents
⚠️ This page may combine multiple inventors who share the name “TAKAHASHI MASAKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PIONEER CORP
8 patentsUS6147942ANov 14, 2000
Focus control apparatus for multilayer optical recording medium
PIONEER CORP22 citations92
US6683826B1Jan 27, 2004
System for reproducing information recorded on an information recording medium
PIONEER CORP13 citations84
US6574171B1Jun 3, 2003
System for reproducing recording mediums
PIONEER CORP9 citations73
US7113457B2Sep 26, 2006
Information reproducing system having means for preventing a breakdown thereof caused by abnormal conditions
PIONEER CORP2 citations62
US11269438B2Mar 8, 2022
Electronic device
PIONEER CORP0 citations60
US6333901B1Dec 25, 2001
Disc reproducing apparatus for determining a track jump
PIONEER CORP1 citations52
US6252832B1Jun 26, 2001
Initializing position for transporting a reproducing apparatus
PIONEER CORP1 citations52
US11073923B2Jul 27, 2021
Input device
PIONEER CORP0 citations50
HITACHI HIGH TECH CORP
7 patentsUS7476856B2Jan 13, 2009
Sample dimension-measuring method and charged particle beam apparatus
HITACHI HIGH TECH CORP10 citations83
US9401297B2Jul 26, 2016
Electrostatic chuck mechanism and charged particle beam apparatus
HITACHI HIGH TECH CORP5 citations70
US7504627B2Mar 17, 2009
Electron beam inspection apparatus
HITACHI HIGH TECH CORP4 citations63
US7256400B2Aug 14, 2007
Electron beam inspection apparatus
HITACHI HIGH TECH CORP4 citations63
US11690208B2Jun 27, 2023
Electromagnetic field shielding plate, method for manufacturing same, electromagnetic field shielding structure, and semiconductor manufacturing environment
HITACHI HIGH TECH CORP0 citations52
US9666408B2May 30, 2017
Apparatus and method for processing sample, and charged particle radiation apparatus
HITACHI HIGH TECH CORP1 citations52
US9368319B2Jun 14, 2016
Method for removing foreign substances in charged particle beam device, and charged particle beam device
HITACHI HIGH TECH CORP1 citations50
CANON KK
5 patentsUS12539600B2Feb 3, 2026
Robot system, method of controlling the robot system, recording medium, method of teaching the robot system, and method of manufacturing products
CANON KK0 citations63
US11872698B2Jan 16, 2024
Controller of robot and control method
CANON KK1 citations62
US9104350B2Aug 11, 2015
Information processing apparatus, and printing control method for displaying screen for setting values
CANON KK2 citations62
US11685042B2Jun 27, 2023
Working robot and control method for working robot
CANON KK0 citations52
US9025175B2May 5, 2015
Storage medium, information processing apparatus, and control method
CANON KK0 citations52
SUMITOMO SEIKA CHEMICALS
3 patentsUS5264236ANov 23, 1993
Method for production of hop extracts and hop extracts obtained thereby
SUMITOMO SEIKA CHEMICALS47 citations90
US5116628AMay 26, 1992
Process for producing liquid egg having reduced cholesterol content
SUMITOMO SEIKA CHEMICALS23 citations89
US5478585ADec 26, 1995
Process for producing lipoprotein-containing substance having reduced lipid content
SUMITOMO SEIKA CHEMICALS19 citations76
HITACHI LTD
3 patentsHONDA MOTOR CO LTD
2 patentsPIONEER ELECTRONIC CORP
2 patentsMINOLTA CO LTD
2 patentsSEITETSU KAGAKU CO LTD
2 patentsDU PONT
2 patentsFUJI XEROX CO LTD
2 patentsTAMA TLO LTD
1 patentSUMITOMO SEIKO CHEMICALS CO LT
1 patentPANASONIC IP MAN CO LTD
1 patentITO TAIRO
1 patentFALTEC CO LTD
1 patentEBUCHI KAZUHISA
1 patentBROTHER IND LTD
1 patentSEIREN KABUSHIKI KAISHA
1 patentHITACHI CONSTRUCTION MACHINERY
1 patentFUJITSU LTD
1 patentIHARA CHEMICAL IND CO
1 patentSUMITOMO CHEMICAL CO
1 patentShowing the top 50 of 62 patents by PatentIndex Score.