Inventor
LEE KI-AM
KR3 patents
Patents
3 patentsUS7598615B2Oct 6, 2009
Analytic structure for failure analysis of semiconductor device having a multi-stacked interconnection structure
SAMSUNG ELECTRONICS CO LTD4 citations59
US7468530B2Dec 23, 2008
Structure and method for failure analysis in a semiconductor device
SAMSUNG ELECTRONICS CO LTD5 citations58
US7747914B2Jun 29, 2010
Memory diagnosis test circuit and test method using the same
SAMSUNG ELECTRONICS CO LTD0 citations48