P

Inventor

LU NING

US135 patents
⚠️ This page may combine multiple inventors who share the name “LU NING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

17 patents
US6303253B1Oct 16, 2001

Hierarchy and domain-balancing method and algorithm for serif mask design in microlithography

IBM83 citations98
US6127071AOct 3, 2000

Serif mask design for correcting severe corner rounding and line end shortening in lithography

IBM56 citations96
US6329107B1Dec 11, 2001

Method of characterizing partial coherent light illumination and its application to serif mask design

IBM20 citations93
US6280887B1Aug 28, 2001

Complementary and exchange mask design methodology for optical proximity correction in microlithography

IBM33 citations93
US6068660AMay 30, 2000

Method and apparatus for determining parasitic capacitance

IBM22 citations93
US6518679B2Feb 11, 2003

Capacitive alignment structure and method for chip stacking

IBM30 citations92
US6214494B1Apr 10, 2001

Serif mask design methodology based on enhancing high spatial frequency contribution for improved printability

IBM34 citations89
US8972917B1Mar 3, 2015

System and method for generating a field effect transistor corner model

IBM12 citations84
US8762911B1Jun 24, 2014

Layout and design system for increasing electric current in CMOS inverters

IBM13 citations84
US8595663B1Nov 26, 2013

Method, system, and program storage device for modeling contact bar resistance

IBM7 citations84
US6901570B2May 31, 2005

Method of generating optimum skew corners for a compact device model

IBM16 citations84
US7640143B2Dec 29, 2009

Circuit statistical modeling for partially correlated model parameters

IBM19 citations81
US6647137B1Nov 11, 2003

Characterizing kernel function in photolithography based on photoresist pattern

IBM8 citations74
US10998263B2May 4, 2021

Back end of line (BEOL) time dependent dielectric breakdown (TDDB) mitigation within a vertical interconnect access (VIA) level of an integrated circuit (IC) device

IBM6 citations73
US9791497B2Oct 17, 2017

Method of characterizing and modeling leakage statistics and threshold voltage for ensemble devices

IBM2 citations73
US9679094B2Jun 13, 2017

Determining correlation coefficient(s) among different field effect transistor types and/or among different electrical parameter types

IBM2 citations73
US9209167B2Dec 8, 2015

Determining threshold voltage variations in field effect transistors

IBM4 citations73

LU NING

10 patents

SAMSUNG DISPLAY CO LTD

4 patents

ITERATED SYSTEMS INC

3 patents

SONY CORP

2 patents

ITT MFG ENTERPRISES INC

2 patents

MOMENTIVE PERFORMANCE MAT INC

2 patents

APPOTRONICS CORP LTD

2 patents

RENSSELAER POLYTECH INST

1 patent

LIGHTING GROUP CO LTD CHINA U

1 patent

THOMPSON ERIC

1 patent

INTEL CORP

1 patent

GLOBALFOUNDRIES INC

1 patent

YANG TAO

1 patent

CIT ALCATEL

1 patent

BATTELLE MEMORIAL INSTITUTE

1 patent

Showing the top 50 of 135 patents by PatentIndex Score.