Inventor

TOBA TADANOBU

JP37 patents

⚠️ This page may combine multiple inventors who share the name “TOBA TADANOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOBA TADANOBU

HITACHI LTD

Programmable device, error storage system, and electronic system device

Semiconductor device and multi-chip module

Recognition apparatus and learning system using neural networks

Soft-error-rate calculating device

Data processing method, edge device, and data processing system

Distributed system and data transfer method

Application logic, and verification method and configuration method thereof

Programmable logic device and logic integration tool

Distributed system and data transmission method

Distributed system and data processing method

Electronic device and attack detection method of electronic device

Programmable device, and controller using the same

Processor system and failure diagnosis method

Calculation system and calculation method

Semiconductor LSI design device and design method

Semiconductor LSI design device and design method

Method of diagnosing circuit board, circuit board, and CPU unit

Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)

Display device

HITACHI AUTOMOTIVE SYSTEMS LTD

Vehicle control device and electronic control system

Prediction control device and method

Electronic control device and preferential error detection method of configuration memory

Electronic control device and circuit reconfiguration method

Electronic control device for processing circuit diagnostics

HITACHI HIGH TECH CORP

Method and apparatus for inspecting defects of semiconductor device

Test apparatus

Data processing device, semiconductor external view inspection device, and data volume increase alleviation method

Semiconductor inspecting apparatus

HITACHI ASTEMO LTD

Electronic control unit and determination method

Arithmetic operation device, testing method

Electronic control unit

IBE HIDEFUMI

Electronic apparatus

Measurement device and measurement method

ELPIDA MEMORY INC

Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory

RENESAS TECH CORP

Semiconductor device, and the method of testing or making of the semiconductor device

HIRANO KATSUNORI

Test apparatus

TOBA TADANOBU

Simulation apparatus and simulation method for determining soft error rates for a configured model