Inventor
DEKKERS NICOLAAS H
3 patents
Patents
3 patentsUS4379230AApr 5, 1983
Automatic beam correction in a scanning transmission electron microscope
PHILIPS CORP12 citations70
US4691103ASep 1, 1987
Microscope for non-differentiated phase image formation
PHILIPS CORP17 citations69
US4352015ASep 28, 1982
Anti-contamination diaphragm for an electron beam apparatus
PHILIPS CORP10 citations67