Inventor
CHANG TOM Y
US4 patents
Patents
4 patentsUS7437626B2Oct 14, 2008
Efficient method of test and soft repair of SRAM with redundancy
IBM21 citations91
US7793173B2Sep 7, 2010
Efficient memory product for test and soft repair of SRAM with redundancy
IBM11 citations83
US7219275B2May 15, 2007
Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy
IBM7 citations72
US7076710B2Jul 11, 2006
Non-binary address generation for ABIST
IBM10 citations72