Inventor

HARADA KANAKO

JP2 patents

⚠️ This page may combine multiple inventors who share the name “HARADA KANAKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

1 patent

US6826735B2Nov 30, 2004

Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device

HITACHI LTD34 citations90

HITACHI HIGH TECH CORP

1 patent

US6928375B2Aug 9, 2005

Inspection condition setting program, inspection device and inspection system

HITACHI HIGH TECH CORP8 citations70