Inventor · disambiguated record
Robert William Tait
Also filed as: TAIT ROBERT · TAIT ROBERT W · TAIT ROBERT WILLIAM
20 granted patents·8 pending applications·256 citations·filing 1998–2024
94Inventor score
Files withGEN ELECTRIC14INTELLIGENT REASONING SYSTEMS3BOYD CORP2ABRAMOVICH GIL1ALLEN JASON RANDOLPH1
Top patents by PatentIndex Score
28 records- 0195US9724876B2Operational performance assessment of additive manufacturingGEN ELECTRIC·Filed 2013·Granted Aug 8, 2017·49 cites·23 claims
- 0290US6598994B1Multi-angle inspection of manufactured productsINTELLIGENT REASONING SYSTEMS·Filed 2000·Granted Jul 29, 2003·47 cites·51 claims
- 0387US8919004B2Digital feeler gauge and method of using sameGEN ELECTRIC·Filed 2012·Granted Dec 30, 2014·11 cites·20 claims
- 0487US8160832B2Apparatus and method for identifying a defect and/or operating characteristic of a systemLUO HUAGENG·Filed 2010·Granted Apr 17, 2012·13 cites·8 claims
- 0585US8244488B2Thermal inspection systemsALLEN JASON RANDOLPH·Filed 2010·Granted Aug 14, 2012·21 cites·22 claims
- 0685US7693673B2Apparatus and method for identifying a defect and/or operating characteristic of a systemGEN ELECTRIC·Filed 2007·Granted Apr 6, 2010·17 cites·14 claims
- 0784US6286978B1Light array system and method for illumination of objects imaged by imaging systemsINTELLIGENT REASONING SYSTEMS·Filed 2000·Granted Sep 11, 2001·25 cites·21 claims
- 0879US6161941ALight array system and method for illumination of objects imaged by imaging systemsINTELLIGENT REASONING SYSTEMS·Filed 1998·Granted Dec 19, 2000·48 cites·40 claims
- 0977US7199386B2System and method for detecting defects in a light-management filmGEN ELECTRIC·Filed 2004·Granted Apr 3, 2007·12 cites·17 claims
- 1072US9719766B2Method and system for measurement using a telescopic gaugeGEN ELECTRIC·Filed 2015·Granted Aug 1, 2017·2 cites·20 claims
- 1171US10192298B2System and method for monitoring tape ends of a composite layup machineGEN ELECTRIC·Filed 2015·Granted Jan 29, 2019·1 cites·7 claims
- 1271US9255779B2Wireless taper gauge and method of using sameGEN ELECTRIC·Filed 2013·Granted Feb 9, 2016·3 cites·17 claims
- 1364US7492450B2Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Granted Feb 17, 2009·4 cites·25 claims
- 1463US10842046B2Densified foam for thermal insulation in electronic devicesBOYD CORP·Filed 2019·Granted Nov 17, 2020·0 cites·11 claims
- 1559US2025237498A1Optical spatial probeOptical Metrology Solutions LLC·Filed 2024·Application pending·0 cites
- 1654US7466426B2Phase shifting imaging module and method of imagingGEN ELECTRIC·Filed 2005·Granted Dec 16, 2008·2 cites·17 claims
- 1754US7435986B2System and method for detecting repeating defects in a light-management filmSABIC INNOVATIVE PLASTICS IP·Filed 2006·Granted Oct 14, 2008·0 cites·14 claims
- 1852US2010140236A1Laser machining system and methodGEN ELECTRIC·Filed 2008·Application pending·0 cites
- 1950US10448541B2Densified foam for thermal insulation in electronic devicesBOYD CORP·Filed 2016·Granted Oct 15, 2019·0 cites·2 claims
- 2049US8063385B2Method and apparatus for ultraviolet scan planningFILKINS ROBERT JOHN·Filed 2009·Granted Nov 22, 2011·1 cites·21 claims
- 2148US9441937B2Method and apparatus for measuring thickness of an objectGEN ELECTRIC·Filed 2014·Granted Sep 13, 2016·0 cites·18 claims
- 2245US2008314878A1Apparatus and method for controlling a machining systemGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2344US2007115464A1System and method for inspection of filmsHARDING KEVIN G·Filed 2005·Application pending·0 cites
- 2443US2008238338A1Method and system for providing scalable and configurable illuminationLATHAM STEPHEN ANDREW·Filed 2007·Application pending·0 cites
- 2541US9007689B2Method and apparatus for forming multiple imagesABRAMOVICH GIL·Filed 2011·Granted Apr 14, 2015·0 cites·4 claims
- 2640US2009245594A1Iris imaging and iris-based identificationGEN ELECTRIC·Filed 2008·Application pending·0 cites
- 2736US2012149281A1Distance measurement systems and methodsWAN XINJUN·Filed 2011·Application pending·0 cites
- 2831US2017055106A1Secondary data communication methodology for metrological device augmentationGEN ELECTRIC·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →