Inventor
DOYLE BRIAN
US95 patents
⚠️ This page may combine multiple inventors who share the name “DOYLE BRIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
43 patentsUS7183597B2Feb 27, 2007
Quantum wire gate device and method of making same
INTEL CORP196 citations99
US7170120B2Jan 30, 2007
Carbon nanotube energy well (CNEW) field effect transistor
INTEL CORP149 citations99
US6790704B2Sep 14, 2004
Method for capacitively coupling electronic devices
INTEL CORP188 citations99
US6696345B2Feb 24, 2004
Metal-gate electrode for CMOS transistor applications
INTEL CORP164 citations99
US6373111B1Apr 16, 2002
Work function tuning for MOSFET gate electrodes
INTEL CORP181 citations99
US6228691B1May 8, 2001
Silicon-on-insulator devices and method for producing the same
INTEL CORP155 citations99
US7494862B2Feb 24, 2009
Methods for uniform doping of non-planar transistor structures
INTEL CORP70 citations98
US6974733B2Dec 13, 2005
Double-gate transistor with enhanced carrier mobility
INTEL CORP95 citations98
US5891798AApr 6, 1999
Method for forming a High dielectric constant insulator in the fabrication of an integrated circuit
INTEL CORP95 citations98
US7071064B2Jul 4, 2006
U-gate transistors and methods of fabrication
INTEL CORP96 citations97
US7550333B2Jun 23, 2009
Nonplanar device with thinned lower body portion and method of fabrication
INTEL CORP50 citations96
US7042009B2May 9, 2006
High mobility tri-gate devices and methods of fabrication
INTEL CORP80 citations96
US6967140B2Nov 22, 2005
Quantum wire gate device and method of making same
INTEL CORP43 citations96
US6306742B1Oct 23, 2001
Method for forming a high dielectric constant insulator in the fabrication of an integrated circuit
INTEL CORP57 citations96
US7709312B2May 4, 2010
Methods for inducing strain in non-planar transistor structures
INTEL CORP34 citations93
US7666727B2Feb 23, 2010
Semiconductor device having a laterally modulated gate workfunction and method of fabrication
INTEL CORP39 citations93
US7473947B2Jan 6, 2009
Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby
INTEL CORP20 citations93
US7285829B2Oct 23, 2007
Semiconductor device having a laterally modulated gate workfunction and method of fabrication
INTEL CORP41 citations93
US7098507B2Aug 29, 2006
Floating-body dynamic random access memory and method of fabrication in tri-gate technology
INTEL CORP32 citations93
US6998686B2Feb 14, 2006
Metal-gate electrode for CMOS transistor applications
INTEL CORP23 citations93
US6737710B2May 18, 2004
Transistor structure having silicide source/drain extensions
INTEL CORP34 citations93
US6310400B1Oct 30, 2001
Apparatus for capacitively coupling electronic devices
INTEL CORP23 citations93
US6121093ASep 19, 2000
Method of making asymmetrical transistor structures
INTEL CORP28 citations93
US5863832AJan 26, 1999
Capping layer in interconnect system and method for bonding the capping layer onto the interconnect system
INTEL CORP70 citations93
US7759774B2Jul 20, 2010
Shielded structures to protect semiconductor devices
INTEL CORP15 citations92
US6794232B2Sep 21, 2004
Method of making MOSFET gate electrodes with tuned work function
INTEL CORP29 citations92
US6790731B2Sep 14, 2004
Method for tuning a work function for MOSFET gate electrodes
INTEL CORP21 citations92
US6696369B2Feb 24, 2004
Method of creating shielded structures to protect semiconductor devices
INTEL CORP27 citations92
US6664173B2Dec 16, 2003
Hardmask gate patterning technique for all transistors using spacer gate approach for critical dimension control
INTEL CORP27 citations89
US9253884B2Feb 2, 2016
Electronic fabric with incorporated chip and interconnect
INTEL CORP6 citations84
US8361871B2Jan 29, 2013
Trigate static random-access memory with independent source and drain engineering, and devices made therefrom
INTEL CORP9 citations84
US7936025B2May 3, 2011
Metalgate electrode for PMOS transistor
INTEL CORP13 citations84
US7608883B2Oct 27, 2009
Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric
INTEL CORP13 citations84
US7422971B2Sep 9, 2008
Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby
INTEL CORP10 citations84
US7342277B2Mar 11, 2008
Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric
INTEL CORP13 citations84
US6025254AFeb 15, 2000
Low resistance gate electrode layer and method of making same
INTEL CORP16 citations84
US6400015B1Jun 4, 2002
Method of creating shielded structures to protect semiconductor devices
INTEL CORP12 citations82
US6638835B2Oct 28, 2003
Method for bonding and debonding films using a high-temperature polymer
INTEL CORP16 citations79
US7833889B2Nov 16, 2010
Apparatus and methods for improving multi-gate device performance
INTEL CORP7 citations74
US7514746B2Apr 7, 2009
Floating-body dynamic random access memory and method of fabrication in tri-gate technology
INTEL CORP5 citations74
US7427541B2Sep 23, 2008
Carbon nanotube energy well (CNEW) field effect transistor
INTEL CORP8 citations74
US6784491B2Aug 31, 2004
MOS devices with reduced fringing capacitance
INTEL CORP7 citations74
US11386951B2Jul 12, 2022
Multi-level magnetic tunnel junction (MTJ) devices including mobile magnetic skyrmions or ferromagnetic domains
INTEL CORP2 citations73
SHAH UDAY
2 patentsOGUZ KAAN
2 patentsDIGITAL EQUIPMENT CORP
1 patentDOYLE BRIAN
1 patentJIN BEEN-YIH
1 patentShowing the top 50 of 95 patents by PatentIndex Score.