Inventor
SKRABANEK SUSAN EILEEN
US4 patents
Patents
4 patentsUS7917897B2Mar 29, 2011
Defect resolution methodology and target assessment process with a software system
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Defect resolution methodology and data defects quality/risk metric model extension
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US7548542B2Jun 16, 2009
Methods and apparatus for transferring data
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US7047234B2May 16, 2006
System and method for managing database access
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