Inventor
SOHN DONG KYUN
SG28 patents
⚠️ This page may combine multiple inventors who share the name “SOHN DONG KYUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHARTERED SEMICONDUCTOR MFG
13 patentsUS6946349B1Sep 20, 2005
Method for integrating a SONOS gate oxide transistor into a logic/analog integrated circuit having several gate oxide thicknesses
CHARTERED SEMICONDUCTOR MFG113 citations96
US7479425B2Jan 20, 2009
Method for forming high-K charge storage device
CHARTERED SEMICONDUCTOR MFG40 citations92
US7202140B1Apr 10, 2007
Method to fabricate Ge and Si devices together for performance enhancement
CHARTERED SEMICONDUCTOR MFG21 citations92
US7029976B1Apr 18, 2006
Method for SONOS EFLASH integrated circuit
CHARTERED SEMICONDUCTOR MFG26 citations86
US7256112B2Aug 14, 2007
Laser activation of implanted contact plug for memory bitline fabrication
CHARTERED SEMICONDUCTOR MFG15 citations84
US6995078B2Feb 7, 2006
Method of forming a relaxed semiconductor buffer layer on a substrate with a large lattice mismatch
CHARTERED SEMICONDUCTOR MFG12 citations84
US7727856B2Jun 1, 2010
Selective STI stress relaxation through ion implantation
CHARTERED SEMICONDUCTOR MFG10 citations82
US7338886B2Mar 4, 2008
Implantation-less approach to fabricating strained semiconductor on isolation wafers
CHARTERED SEMICONDUCTOR MFG6 citations74
US7166522B2Jan 23, 2007
Method of forming a relaxed semiconductor buffer layer on a substrate with a large lattice mismatch
CHARTERED SEMICONDUCTOR MFG3 citations63
US7202164B2Apr 10, 2007
Method of forming ultra thin silicon oxynitride for gate dielectric applications
CHARTERED SEMICONDUCTOR MFG4 citations61
US7645687B2Jan 12, 2010
Method to fabricate variable work function gates for FUSI devices
CHARTERED SEMICONDUCTOR MFG5 citations56
US7585746B2Sep 8, 2009
Process integration scheme of SONOS technology
CHARTERED SEMICONDUCTOR MFG4 citations56
US7326609B2Feb 5, 2008
Semiconductor device and fabrication method
CHARTERED SEMICONDUCTOR MFG0 citations52
HYUNDAI ELECTRONICS IND
4 patentsUS6251780B1Jun 26, 2001
Method for fabricating thin film at high temperature
HYUNDAI ELECTRONICS IND32 citations92
US6528401B2Mar 4, 2003
Method for fabricating polycide dual gate in semiconductor device
HYUNDAI ELECTRONICS IND16 citations84
US6177335B1Jan 23, 2001
Method of forming polycide
HYUNDAI ELECTRONICS IND8 citations74
US6885103B2Apr 26, 2005
Semiconductor device including ternary phase diffusion barrier
HYUNDAI ELECTRONICS IND1 citations52
GLOBALFOUNDRIES SG PTE LTD
4 patentsUS8358007B2Jan 22, 2013
Integrated circuit system employing low-k dielectrics and method of manufacture thereof
GLOBALFOUNDRIES SG PTE LTD18 citations82
US7888214B2Feb 15, 2011
Selective stress relaxation of contact etch stop layer through layout design
GLOBALFOUNDRIES SG PTE LTD5 citations63
US8008744B2Aug 30, 2011
Selective STI stress relaxation through ion implantation
GLOBALFOUNDRIES SG PTE LTD2 citations61
US8034670B2Oct 11, 2011
Reliable memory cell
GLOBALFOUNDRIES SG PTE LTD3 citations60
SAMSUNG ELECTRONICS CO LTD
2 patentsUS9425148B2Aug 23, 2016
Semiconductor devices having contacts with intervening spacers and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations41
US9502413B2Nov 22, 2016
Semiconductor devices including raised source/drain stressors and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations36