Inventor
KIM JONG-AN
KR16 patents
⚠️ This page may combine multiple inventors who share the name “KIM JONG-AN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
9 patentsUS7767506B2Aug 3, 2010
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask
SAMSUNG ELECTRONICS CO LTD6 citations71
US7449352B2Nov 11, 2008
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask
SAMSUNG ELECTRONICS CO LTD6 citations71
US8055056B2Nov 8, 2011
Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD3 citations63
US8050488B2Nov 1, 2011
Method of analyzing a wafer sample
SAMSUNG ELECTRONICS CO LTD6 citations63
US7804591B2Sep 28, 2010
Wafer inspecting method
SAMSUNG ELECTRONICS CO LTD3 citations63
US8055057B2Nov 8, 2011
Method for detecting defects in a substrate having a semiconductor device thereon
SAMSUNG ELECTRONICS CO LTD2 citations62
US8034640B2Oct 11, 2011
Apparatus and method to inspect defect of semiconductor device
SAMSUNG ELECTRONICS CO LTD5 citations62
US7728966B2Jun 1, 2010
Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using same
SAMSUNG ELECTRONICS CO LTD4 citations61
US10989520B2Apr 27, 2021
Methods for nondestructive measurements of thickness of underlying layers
SAMSUNG ELECTRONICS CO LTD0 citations45