Inventor
AOKI HIDEMITSU
JP70 patents
⚠️ This page may combine multiple inventors who share the name “AOKI HIDEMITSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
28 patentsUS6423148B1Jul 23, 2002
Substrate-cleaning method and substrate-cleaning solution
NEC CORP94 citations98
US5676760AOct 14, 1997
Method for wet processing of a semiconductor substrate
NEC CORP113 citations97
US6683007B1Jan 27, 2004
Etching and cleaning methods and etching and cleaning apparatus used therefor
NEC CORP68 citations96
US6387190B1May 14, 2002
Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring
NEC CORP45 citations96
US6225217B1May 1, 2001
Method of manufacturing semiconductor device having multilayer wiring
NEC CORP52 citations96
US5833831ANov 10, 1998
Method and system for generating electrolyzed water
NEC CORP55 citations96
US5635053AJun 3, 1997
Method and apparatus for cleaning electronic parts
NEC CORP90 citations96
US5616221AApr 1, 1997
Electrolytic ionized water producing apparatus
NEC CORP91 citations96
US5578193ANov 26, 1996
Method and apparatus for wet treatment of solid surfaces
NEC CORP56 citations96
US6787480B2Sep 7, 2004
Manufacturing method of semicondcutor device
NEC CORP49 citations95
US5762779AJun 9, 1998
Method for producing electrolyzed water
NEC CORP84 citations95
US5599438AFeb 4, 1997
Method for producing electrolyzed water
NEC CORP54 citations95
US6465352B1Oct 15, 2002
Method for removing dry-etching residue in a semiconductor device fabricating process
NEC CORP38 citations93
US6444583B2Sep 3, 2002
Substrate-cleaning method and substrate-cleaning solution
NEC CORP30 citations93
US6183351B1Feb 6, 2001
Method of supplying a chemical mechanical polishing liquid and apparatus therefor
NEC CORP23 citations93
US6136708AOct 24, 2000
Method for manufacturing semiconductor device
NEC CORP22 citations93
US6051124AApr 18, 2000
Zeta-potential determining apparatus
NEC CORP22 citations93
US6036581AMar 14, 2000
Substrate cleaning method and apparatus
NEC CORP40 citations93
US5989919ANov 23, 1999
Method for analyzing contamination within hole in semiconductor device
NEC CORP43 citations93
US6319801B1Nov 20, 2001
Method for cleaning a substrate and cleaning solution
NEC CORP33 citations92
US5543030AAug 6, 1996
Method for producing electrolyzed water
NEC CORP42 citations92
US5549798AAug 27, 1996
Wet processing apparatus having individual reactivating feedback paths for anode and cathode water
NEC CORP21 citations91
US6524376B2Feb 25, 2003
Anticorrosive agent
NEC CORP32 citations90
US6992050B2Jan 31, 2006
Stripping agent composition and method of stripping
NEC CORP17 citations80
US6387821B1May 14, 2002
Method of manufacturing a semiconductor device
NEC CORP12 citations74
US6241584B1Jun 5, 2001
Method of washing a semiconductor device
NEC CORP10 citations74
US6140225AOct 31, 2000
Method of manufacturing semiconductor device having multilayer wiring
NEC CORP15 citations74
US5994142ANov 30, 1999
Method for collecting a metallic contaminants from a wafer
NEC CORP15 citations74
NEC ELECTRONICS CORP
17 patentsUS6624061B2Sep 23, 2003
Semiconductor device and method of manufacturing the same capable of reducing deterioration of low dielectric constant film
NEC ELECTRONICS CORP26 citations93
US7138362B2Nov 21, 2006
Washing liquid composition for semiconductor substrate
NEC ELECTRONICS CORP23 citations92
US6964724B2Nov 15, 2005
Etching and cleaning methods and etching and cleaning apparatuses used therefor
NEC ELECTRONICS CORP21 citations92
US6890391B2May 10, 2005
Method of manufacturing semiconductor device and apparatus for cleaning substrate
NEC ELECTRONICS CORP33 citations92
US6592677B1Jul 15, 2003
Method of forming a semiconductor device by simultaneously cleaning both sides of a wafer using different cleaning solutions
NEC ELECTRONICS CORP31 citations92
US6869921B2Mar 22, 2005
Stripping composition
NEC ELECTRONICS CORP48 citations89
US6998352B2Feb 14, 2006
Cleaning method, method for fabricating semiconductor device and cleaning solution
NEC ELECTRONICS CORP14 citations84
US6897150B1May 24, 2005
Semiconductor wafer surface and method of treating a semiconductor wafer surface
NEC ELECTRONICS CORP13 citations84
US6864187B2Mar 8, 2005
Method of washing a semiconductor wafer
NEC ELECTRONICS CORP14 citations84
US6833109B1Dec 21, 2004
Method and apparatus for storing a semiconductor wafer after its CMP polishing
NEC ELECTRONICS CORP16 citations84
US7268087B2Sep 11, 2007
Manufacturing method of semiconductor device
NEC ELECTRONICS CORP10 citations83
US7170172B2Jan 30, 2007
Semiconductor device having a roughened surface
NEC ELECTRONICS CORP14 citations83
US7087562B2Aug 8, 2006
Post-CMP washing liquid composition
NEC ELECTRONICS CORP16 citations83
US6890864B2May 10, 2005
Semiconductor device fabricating method and treating liquid
NEC ELECTRONICS CORP12 citations83
US7312160B2Dec 25, 2007
Removing solution, cleaning method for semiconductor substrate, and process for production of semiconductor device
NEC ELECTRONICS CORP6 citations74
US6797648B2Sep 28, 2004
Cleaning water for cleaning a wafer and method of cleaning a wafer
NEC ELECTRONICS CORP7 citations74
US6767409B2Jul 27, 2004
Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring
NEC ELECTRONICS CORP8 citations74
KANTO KAGAKU
3 patentsUS7312186B2Dec 25, 2007
Cleaning solution for semiconductor substrate
KANTO KAGAKU19 citations92
US6080709AJun 27, 2000
Cleaning solution for cleaning substrates to which a metallic wiring has been applied
KANTO KAGAKU43 citations92
US6787293B2Sep 7, 2004
Photoresist residue remover composition
KANTO KAGAKU15 citations82
SUMITOMO CHEMICAL CO
1 patentRENESAS ELECTRONICS CORP
1 patentShowing the top 50 of 70 patents by PatentIndex Score.