P

Inventor

AOKI HIDEMITSU

JP70 patents
⚠️ This page may combine multiple inventors who share the name “AOKI HIDEMITSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

28 patents
US6423148B1Jul 23, 2002

Substrate-cleaning method and substrate-cleaning solution

NEC CORP94 citations98
US5676760AOct 14, 1997

Method for wet processing of a semiconductor substrate

NEC CORP113 citations97
US6683007B1Jan 27, 2004

Etching and cleaning methods and etching and cleaning apparatus used therefor

NEC CORP68 citations96
US6387190B1May 14, 2002

Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring

NEC CORP45 citations96
US6225217B1May 1, 2001

Method of manufacturing semiconductor device having multilayer wiring

NEC CORP52 citations96
US5833831ANov 10, 1998

Method and system for generating electrolyzed water

NEC CORP55 citations96
US5635053AJun 3, 1997

Method and apparatus for cleaning electronic parts

NEC CORP90 citations96
US5616221AApr 1, 1997

Electrolytic ionized water producing apparatus

NEC CORP91 citations96
US5578193ANov 26, 1996

Method and apparatus for wet treatment of solid surfaces

NEC CORP56 citations96
US6787480B2Sep 7, 2004

Manufacturing method of semicondcutor device

NEC CORP49 citations95
US5762779AJun 9, 1998

Method for producing electrolyzed water

NEC CORP84 citations95
US5599438AFeb 4, 1997

Method for producing electrolyzed water

NEC CORP54 citations95
US6465352B1Oct 15, 2002

Method for removing dry-etching residue in a semiconductor device fabricating process

NEC CORP38 citations93
US6444583B2Sep 3, 2002

Substrate-cleaning method and substrate-cleaning solution

NEC CORP30 citations93
US6183351B1Feb 6, 2001

Method of supplying a chemical mechanical polishing liquid and apparatus therefor

NEC CORP23 citations93
US6136708AOct 24, 2000

Method for manufacturing semiconductor device

NEC CORP22 citations93
US6051124AApr 18, 2000

Zeta-potential determining apparatus

NEC CORP22 citations93
US6036581AMar 14, 2000

Substrate cleaning method and apparatus

NEC CORP40 citations93
US5989919ANov 23, 1999

Method for analyzing contamination within hole in semiconductor device

NEC CORP43 citations93
US6319801B1Nov 20, 2001

Method for cleaning a substrate and cleaning solution

NEC CORP33 citations92
US5543030AAug 6, 1996

Method for producing electrolyzed water

NEC CORP42 citations92
US5549798AAug 27, 1996

Wet processing apparatus having individual reactivating feedback paths for anode and cathode water

NEC CORP21 citations91
US6524376B2Feb 25, 2003

Anticorrosive agent

NEC CORP32 citations90
US6992050B2Jan 31, 2006

Stripping agent composition and method of stripping

NEC CORP17 citations80
US6387821B1May 14, 2002

Method of manufacturing a semiconductor device

NEC CORP12 citations74
US6241584B1Jun 5, 2001

Method of washing a semiconductor device

NEC CORP10 citations74
US6140225AOct 31, 2000

Method of manufacturing semiconductor device having multilayer wiring

NEC CORP15 citations74
US5994142ANov 30, 1999

Method for collecting a metallic contaminants from a wafer

NEC CORP15 citations74

NEC ELECTRONICS CORP

17 patents
US6624061B2Sep 23, 2003

Semiconductor device and method of manufacturing the same capable of reducing deterioration of low dielectric constant film

NEC ELECTRONICS CORP26 citations93
US7138362B2Nov 21, 2006

Washing liquid composition for semiconductor substrate

NEC ELECTRONICS CORP23 citations92
US6964724B2Nov 15, 2005

Etching and cleaning methods and etching and cleaning apparatuses used therefor

NEC ELECTRONICS CORP21 citations92
US6890391B2May 10, 2005

Method of manufacturing semiconductor device and apparatus for cleaning substrate

NEC ELECTRONICS CORP33 citations92
US6592677B1Jul 15, 2003

Method of forming a semiconductor device by simultaneously cleaning both sides of a wafer using different cleaning solutions

NEC ELECTRONICS CORP31 citations92
US6869921B2Mar 22, 2005

Stripping composition

NEC ELECTRONICS CORP48 citations89
US6998352B2Feb 14, 2006

Cleaning method, method for fabricating semiconductor device and cleaning solution

NEC ELECTRONICS CORP14 citations84
US6897150B1May 24, 2005

Semiconductor wafer surface and method of treating a semiconductor wafer surface

NEC ELECTRONICS CORP13 citations84
US6864187B2Mar 8, 2005

Method of washing a semiconductor wafer

NEC ELECTRONICS CORP14 citations84
US6833109B1Dec 21, 2004

Method and apparatus for storing a semiconductor wafer after its CMP polishing

NEC ELECTRONICS CORP16 citations84
US7268087B2Sep 11, 2007

Manufacturing method of semiconductor device

NEC ELECTRONICS CORP10 citations83
US7170172B2Jan 30, 2007

Semiconductor device having a roughened surface

NEC ELECTRONICS CORP14 citations83
US7087562B2Aug 8, 2006

Post-CMP washing liquid composition

NEC ELECTRONICS CORP16 citations83
US6890864B2May 10, 2005

Semiconductor device fabricating method and treating liquid

NEC ELECTRONICS CORP12 citations83
US7312160B2Dec 25, 2007

Removing solution, cleaning method for semiconductor substrate, and process for production of semiconductor device

NEC ELECTRONICS CORP6 citations74
US6797648B2Sep 28, 2004

Cleaning water for cleaning a wafer and method of cleaning a wafer

NEC ELECTRONICS CORP7 citations74
US6767409B2Jul 27, 2004

Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring

NEC ELECTRONICS CORP8 citations74

KANTO KAGAKU

3 patents

SUMITOMO CHEMICAL CO

1 patent

RENESAS ELECTRONICS CORP

1 patent

Showing the top 50 of 70 patents by PatentIndex Score.