Inventor

LI SHIFANG

US101 patents

⚠️ This page may combine multiple inventors who share the name “LI SHIFANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LI SHIFANG

GM GLOBAL TECH OPERATIONS LLC

Hybrid vehicle propulsion systems and methods

Providing driver feedback

Methods for reconfigurable battery charger control

Reconfigurable vehicle seat for children

System with solenoid assembly and method of fault diagnosis and isolation

Automatic reconfiguration and calibration of haptic seats

System and method for predicting a pedal position based on driver behavior and controlling one or more engine actuators based on the predicted pedal position

Method and apparatus for determining NOx content in an exhaust gas feedstream of an internal combustion engine

System and method for adjusting target actuator values of an engine using model predictive control to satisfy emissions and drivability targets and maximize fuel efficiency

Battery electric vehicle energy storage system and method

Electric powertrain with multi-pack battery system

Predictive control of ammonia storage in a selective catalytic reduction device using connectivity information

Battery system and a method for use in the battery system

Battery pack balancing systems and control logic for multi-pack electric-drive motor vehicles

TIMBRE TECH INC

Examining a structure formed on a semiconductor wafer using machine learning systems

Azimuthal scanning of a structure formed on a semiconductor wafer

Generic interface for an optical metrology system

Optical metrology model optimization for repetitive structures

In-die optical metrology

Generic interface for an optical metrology system

Optimization of diffraction order selection for two-dimensional structures

Library accuracy enhancement and evaluation

Azimuthal scanning of a structure formed on a semiconductor wafer

Generic interface for an optical metrology system

TOKYO ELECTRON LTD

Optical metrology using a photonic nanojet

Controlling a fabrication tool using support vector machine

Optimizing sensitivity of optical metrology measurements

Automated process control of a fabrication tool using a dispersion function relating process parameter to dispersion

Optical metrology model optimization based on goals

Controlling a fabrication tool using support vector machine

Determining position accuracy of double exposure lithography using optical metrology

Automated process control using parameters determined with approximation and fine diffraction models

Library accuracy enhancment and evaluation

System for in-situ film stack measurement during etching and etch control method

KLA TENCOR CORP

All surface film metrology system

Apparatus and methods for measuring properties in a TSV structure using beam profile reflectometry

Increasing dynamic range of a height sensor for inspection and metrology

Line scan spectroscopic white light interferometry for semiconductor inspection and metrology

System and method for semiconductor wafer inspection and metrology

Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy

LI SHIFANG

Optimization of ray tracing and beam propagation parameters

Method of enhancing an optical metrology system using ray tracing and flexible ray libraries

Method of regenerating diffraction signals for optical metrology systems

Process control using ray tracing-based libraries and machine learning systems

OPLINK COMMUNICATIONS INC

Cascaded filter employing an AOTF and narrowband birefringent filters

Multiple optical switches using refractive optics

TRANSAMERICAN TECHNOLOGIES INT

Universal endoscope video adaptor with zoom

TRANSAMERICA TECHNOLOGIES INTE

Endoscope video adapter with zoom

NANOMETRICS INC

Optical metrology with multiple angles of incidence and/or azimuth angles

KLA CORP

Determining metrology-like information for a specimen using an inspection tool