Inventor

YOSHIDA MINORU

JP369 patents

⚠️ This page may combine multiple inventors who share the name “YOSHIDA MINORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YOSHIDA MINORU

HITACHI LTD

Defect inspection method and apparatus

Method and apparatus for inspecting defects in a patterned specimen

Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected

Computer system including a device with a plurality of identifiers

Computer system including a computer which requests an access to a logical address in a secondary storage system with specification of a local address in the secondary storage system

Method and apparatus for observing and inspecting defects

Defect inspection method and apparatus therefor

Defect inspection method and apparatus therefor

Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus

Array type disk system updating redundant data asynchronously with data access

Method and equipment for measuring absorptance of light scattering materials using plural wavelengths of light

Method and apparatus for pattern exposure, mask used therefor, and semiconductor integrated circuit produced by using them

Method and equipment for detecting pattern defect

Computer system including a device with a plurality of identifiers

Computer system including a device with a plurality of identifiers

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected

Computer system including a device with a plurality of identifiers

Storage device and method for data sharing

Array type disk system updating redundant data asynchronously with data access

Computer system including a device with a plurality of identifiers

Array disk controller for grouping host commands into a single virtual host command

Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system

Data storing system and data transfer method

Defect inspection method and apparatus

Method and apparatus for picking up 2D image of an object to be sensed

Method and apparatus for inspecting pattern defects

Method and apparatus for inspecting pattern defects

Defect inspection method and apparatus therefor

Method and apparatus for picking up 2D image of an object to be sensed

YOSHIDA MINORU

Rear bumper for automobile

Radiator grill for automobile

Front bumper for automobile

MATSUSHITA ELECTRIC WORKS LTD

Impact-driven rotating device

Automatic tracking lighting equipment, lighting controller and tracking apparatus

HITACHI HIGH TECH CORP

Method and apparatus for inspecting a pattern formed on a substrate

Pattern defect inspection method and its apparatus

(unassigned)

Storage device and method for data sharing

Weighing machine

KYODO KY TEC CORP

Plant cultivation mat

Plant cultivation mat and method for laying the same

FUJI XEROX CO LTD

System employing facsimile units to transmit E-mail between information processors over public telephone lines

HITACHI MEDICAL CORP

Multi-element radiation detector

TORAY INDUSTRIES

Hardcoat film, antireflection film and equipment for display

NOK CORP

Laminated sheet

BEPPU TERUHIKO

Use of trichostatin compounds for treating tumor cells

TOSHIBA KK

Image forming apparatus having fixing device that responds to request when using decolorable ink

RENESAS TECH CORP

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected

NIPPON SHEET GLASS CO LTD

Light emitting diode module

TOSHIBA TEC KK

Image forming apparatus having a transfer device for transferring a toner image and having a bias voltage controller