Inventor
KANEV STOJAN
DE37 patents
⚠️ This page may combine multiple inventors who share the name “KANEV STOJAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SUSS MICROTEC TEST SYS GMBH
12 patentsUS7332923B2Feb 19, 2008
Test probe for high-frequency measurement
SUSS MICROTEC TEST SYS GMBH33 citations92
US7733108B2Jun 8, 2010
Method and arrangement for positioning a probe card
SUSS MICROTEC TEST SYS GMBH9 citations82
US7579849B2Aug 25, 2009
Probe holder for a probe for testing semiconductor components
SUSS MICROTEC TEST SYS GMBH8 citations82
US7057408B2Jun 6, 2006
Method and prober for contacting a contact area with a contact tip
SUSS MICROTEC TEST SYS GMBH11 citations81
US7859278B2Dec 28, 2010
Probe holder for a probe for testing semiconductor components
SUSS MICROTEC TEST SYS GMBH4 citations61
US7741860B2Jun 22, 2010
Prober for testing magnetically sensitive components
SUSS MICROTEC TEST SYS GMBH4 citations61
US7659743B2Feb 9, 2010
Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer
SUSS MICROTEC TEST SYS GMBH3 citations61
US7579854B2Aug 25, 2009
Probe station and method for measurements of semiconductor devices under defined atmosphere
SUSS MICROTEC TEST SYS GMBH4 citations61
US7560942B2Jul 14, 2009
Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
SUSS MICROTEC TEST SYS GMBH2 citations61
US7768271B2Aug 3, 2010
Method for calibration of a vectorial network analyzer having more than two ports
SUSS MICROTEC TEST SYS GMBH2 citations60
US7769555B2Aug 3, 2010
Method for calibration of a vectorial network analyzer
SUSS MICROTEC TEST SYS GMBH2 citations60
US7652491B2Jan 26, 2010
Probe support with shield for the examination of test substrates under use of probe supports
SUSS MICROTEC TEST SYS GMBH4 citations60
MPI CORP
9 patentsUS11144198B2Oct 12, 2021
Control method of touch display apparatus
MPI CORP7 citations82
US11262401B2Mar 1, 2022
Wafer probe station
MPI CORP0 citations61
US11036390B2Jun 15, 2021
Display method of display apparatus
MPI CORP1 citations61
US12196779B2Jan 14, 2025
Probe system and machine apparatus thereof
MPI CORP0 citations59
US11287475B2Mar 29, 2022
Method for compensating to distance between probe tip and device under test after temperature changes
MPI CORP0 citations50
US10895587B2Jan 19, 2021
Wafer probe station
MPI CORP0 citations46
US10312123B2Jun 4, 2019
Method for compensating probe misplacement and probe apparatus
MPI CORP0 citations46
US10096505B2Oct 9, 2018
Wafer cassette
MPI CORP0 citations46
US10048844B2Aug 14, 2018
Operating method for inspecting equipment
MPI CORP0 citations45
CASCADE MICROTECH INC
5 patentsUS7999563B2Aug 16, 2011
Chuck for supporting and retaining a test substrate and a calibration substrate
CASCADE MICROTECH INC5 citations68
US8344744B2Jan 1, 2013
Probe station for on-wafer-measurement under EMI-shielding
CASCADE MICROTECH INC3 citations61
US9632108B2Apr 25, 2017
Method for verifying a test substrate in a prober under defined thermal conditions
CASCADE MICROTECH INC0 citations51
US9395411B2Jul 19, 2016
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
CASCADE MICROTECH INC0 citations51
US9373533B2Jun 21, 2016
Systems and methods for providing wafer access in a wafer processing system
CASCADE MICROTECH INC0 citations39
KANEV STOJAN
3 patentsUS8278951B2Oct 2, 2012
Probe station for testing semiconductor substrates and comprising EMI shielding
KANEV STOJAN8 citations80
US8368413B2Feb 5, 2013
Method for testing electronic components of a repetitive pattern under defined thermal conditions
KANEV STOJAN2 citations59
US9194885B2Nov 24, 2015
Modular prober and method for operating same
KANEV STOJAN3 citations58