Inventor

STOLL KARSTEN

DE11 patents

⚠️ This page may combine multiple inventors who share the name “STOLL KARSTEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CASCADE MICROTECH INC

4 patents

US9784763B1Oct 10, 2017

Shielded probe systems with controlled testing environments

CASCADE MICROTECH INC10 citations78

US7999563B2Aug 16, 2011

Chuck for supporting and retaining a test substrate and a calibration substrate

CASCADE MICROTECH INC5 citations68

US9395411B2Jul 19, 2016

Method for testing a test substrate under defined thermal conditions and thermally conditionable prober

CASCADE MICROTECH INC0 citations51

US10281492B2May 7, 2019

Shielded probe systems with controlled testing environments

CASCADE MICROTECH INC0 citations46

SUSS MICROTEC TEST SYS GMBH

2 patents

US7652491B2Jan 26, 2010

Probe support with shield for the examination of test substrates under use of probe supports

SUSS MICROTEC TEST SYS GMBH4 citations60

US7265536B2Sep 4, 2007

Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station

SUSS MICROTEC TEST SYS GMBH1 citations46

TEICH MICHAEL

1 patent

US8240650B2Aug 14, 2012

Chuck with triaxial construction

TEICH MICHAEL8 citations82

KIESEWETTER JOERG

1 patent

US8497693B2Jul 30, 2013

Method for testing a test substrate under defined thermal conditions and thermally conditionable prober

KIESEWETTER JOERG12 citations81

KANEV STOJAN

1 patent

US8278951B2Oct 2, 2012

Probe station for testing semiconductor substrates and comprising EMI shielding

KANEV STOJAN8 citations80

SUSS MICROTEC TESTSYSTEMS GMBH

1 patent

US7038441B2May 2, 2006

Test apparatus with loading device

SUSS MICROTEC TESTSYSTEMS GMBH7 citations69

RUMIANTSEV ANDREJ

1 patent

US8680879B2Mar 25, 2014

Chuck for supporting and retaining a test substrate and a calibration substrate

RUMIANTSEV ANDREJ0 citations44