Inventor
IMAI EIJI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “IMAI EIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANKYO SEIKI SEISAKUSHO KK
7 patentsUS6189791B1Feb 20, 2001
Magnetic card reader and method for determining the coercive force of a magnetic card therein
SANKYO SEIKI SEISAKUSHO KK32 citations92
US6639688B2Oct 28, 2003
Value-sheet issuing device for selectively assigning common images from a local storage
SANKYO SEIKI SEISAKUSHO KK13 citations83
US6349878B2Feb 26, 2002
Card processing method
SANKYO SEIKI SEISAKUSHO KK15 citations83
US6446872B1Sep 10, 2002
Card reader having a space for discharging foreign matter therein
SANKYO SEIKI SEISAKUSHO KK12 citations73
US5734535AMar 31, 1998
Magnetic head with a useable lifetime detection mechanism
SANKYO SEIKI SEISAKUSHO KK12 citations71
US5428755AJun 27, 1995
Method for automatically modifying program in a flash memory of a magnetic tape unit
SANKYO SEIKI SEISAKUSHO KK7 citations69
US6199760B1Mar 13, 2001
Magnetic card reader and card taking-in method for magnetic card
SANKYO SEIKI SEISAKUSHO KK2 citations62
HITACHI HIGH TECH CORP
6 patentsUS7733473B2Jun 8, 2010
Inspection apparatus and inspection method
HITACHI HIGH TECH CORP6 citations73
US10458924B2Oct 29, 2019
Inspection apparatus and inspection method
HITACHI HIGH TECH CORP3 citations72
US7719671B2May 18, 2010
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP3 citations62
US7999932B2Aug 16, 2011
Inspection apparatus and inspection method
HITACHI HIGH TECH CORP0 citations51
US7986405B2Jul 26, 2011
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP0 citations51
US7898653B2Mar 1, 2011
Foreign matter inspection apparatus
HITACHI HIGH TECH CORP0 citations50